Helium Ion Microscopy - NanoScience and Technology
Latest Publications

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H-INDEX

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Published By Springer International Publishing

9783319419886, 9783319419909

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Focused Helium and Neon Ion Beam Modification of High-T C Superconductors and Magnetic Materials

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_17 ◽

2016 ◽

pp. 415-445 ◽

Cited By ~ 3

Author(s):

Shane A. Cybart ◽

Rantej Bali ◽

Gregor Hlawacek ◽

Falk Röder ◽

Jürgen Fassbender

Keyword(s):

Magnetic Materials ◽

Ion Beam ◽

Ion Beam Modification ◽

Neon Ion

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The Helium Ion Microscope

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_1 ◽

2016 ◽

pp. 3-30 ◽

Cited By ~ 4

Author(s):

John Notte ◽

Jason Huang

Keyword(s):

Helium Ion

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Single Atom Gas Field Ion Sources for Scanning Ion Microscopy

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_2 ◽

2016 ◽

pp. 31-61 ◽

Cited By ~ 2

Author(s):

Radovan Urban ◽

Robert A. Wolkow ◽

Jason L. Pitters

Keyword(s):

Ion Sources ◽

Single Atom ◽

Gas Field ◽

Ion Microscopy

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Helium Ion Microscope Fabrication of Solid-State Nanopore Devices for Biomolecule Analysis

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_18 ◽

2016 ◽

pp. 447-470 ◽

Cited By ~ 5

Author(s):

Osama K. Zahid ◽

Adam R. Hall

Keyword(s):

Solid State ◽

Helium Ion

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Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_12 ◽

2016 ◽

pp. 265-295 ◽

Cited By ~ 2

Author(s):

Rene Heller ◽

Nico Klingner ◽

Gregor Hlawacek

Keyword(s):

Elemental Compositions ◽

Helium Ion ◽

Microscope Imaging

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Monte Carlo Simulations of Focused Ion Beam Induced Processing

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_4 ◽

2016 ◽

pp. 89-118 ◽

Cited By ~ 1

Author(s):

Rajendra Timilsina ◽

Philip D. Rack

Keyword(s):

Monte Carlo ◽

Monte Carlo Simulations ◽

Focused Ion Beam ◽

Ion Beam

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HIM Applications in Combustion Science: Imaging of Catalyst Surfaces and Nascent Soot

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_8 ◽

2016 ◽

pp. 187-203 ◽

Cited By ~ 2

Author(s):

Henning Vieker ◽

André Beyer

Keyword(s):

Catalyst Surfaces

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Helium Ion Microscopy for Two-Dimensional Materials

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_11 ◽

2016 ◽

pp. 245-262 ◽

Cited By ~ 2

Author(s):

Yangbo Zhou ◽

Daniel S. Fox ◽

Hongzhou Zhang

Keyword(s):

Two Dimensional ◽

Helium Ion ◽

Two Dimensional Materials ◽

Ion Microscopy

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HIM of Biological Samples

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_7 ◽

2016 ◽

pp. 173-185 ◽

Cited By ~ 2

Author(s):

Armin Gölzhäuser ◽

Gregor Hlawacek

Keyword(s):

Biological Samples

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Applications of GFIS in Semiconductors

Helium Ion Microscopy - NanoScience and Technology ◽

10.1007/978-3-319-41990-9_19 ◽

2016 ◽

pp. 471-498 ◽

Cited By ~ 5

Author(s):

Shida Tan ◽

Rick Livengood

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Helium Ion Microscopy - NanoScience and TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer International Publishing

Focused Helium and Neon Ion Beam Modification of High-T C Superconductors and Magnetic Materials

The Helium Ion Microscope

Single Atom Gas Field Ion Sources for Scanning Ion Microscopy

Helium Ion Microscope Fabrication of Solid-State Nanopore Devices for Biomolecule Analysis

Backscattering Spectrometry in the Helium Ion Microscope: Imaging Elemental Compositions on the nm Scale

Monte Carlo Simulations of Focused Ion Beam Induced Processing

HIM Applications in Combustion Science: Imaging of Catalyst Surfaces and Nascent Soot

Helium Ion Microscopy for Two-Dimensional Materials

HIM of Biological Samples

Applications of GFIS in Semiconductors

Helium Ion Microscopy - NanoScience and Technology
Latest Publications