1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)
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104

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Radiation effects testing at the 88-inch cyclotron

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858563 ◽

2003 ◽

Cited By ~ 3

Author(s):

M.A. McMahan

Keyword(s):

Radiation Effects

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Radiation effects on active pixel sensors

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858623 ◽

2003 ◽

Cited By ~ 5

Author(s):

M. Cohen ◽

J.P. David

Keyword(s):

Radiation Effects ◽

Active Pixel Sensors ◽

Active Pixel ◽

Pixel Sensors

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4H-SiC MESFETs behavior after high dose irradiation

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858597 ◽

2003 ◽

Author(s):

C. Brisset ◽

O. Noblanc ◽

C. Picard ◽

F. Joffre ◽

C. Brylinski

Keyword(s):

High Dose ◽

Dose Irradiation

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Diamond gamma dose rate monitor

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858556 ◽

2003 ◽

Cited By ~ 1

Author(s):

A. Brambilla ◽

P. Chambaud ◽

D. Tromson ◽

P. Bergonzo ◽

F. Foulon

Keyword(s):

Dose Rate ◽

Gamma Dose ◽

Gamma Dose Rate

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Radiation hardening of power MOSFETs using electrical stress

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858609 ◽

2003 ◽

Author(s):

C. Picard ◽

C. Brisset ◽

O. Quittard ◽

A. Hoffmann ◽

F. Joffre ◽

...

Keyword(s):

Radiation Hardening ◽

Power Mosfets ◽

Electrical Stress

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Generation and confinement of mobile charges in buried oxide of SOI substrates

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858590 ◽

2003 ◽

Author(s):

O. Musseau ◽

S. Krawiec ◽

P. Paillet ◽

A. Courtot-Descharles ◽

O. Gruber

Keyword(s):

Buried Oxide ◽

Mobile Charges ◽

Soi Substrates

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New insights into fully-depleted SOI transistor response after total-dose irradiation

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858599 ◽

2003 ◽

Author(s):

J.R. Schwank ◽

M.R. Shaneyfelt ◽

P.E. Dodd ◽

J.A. Burns ◽

C.L. Keast ◽

...

Keyword(s):

Total Dose ◽

Fully Depleted ◽

Dose Irradiation

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Dynamic testing for radiation induced failures in a standard CMOS submicron technology pixel front-end

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858606 ◽

2003 ◽

Author(s):

D. De Venuto ◽

S. Corsi ◽

M.J. Ohletz

Keyword(s):

Dynamic Testing ◽

Front End ◽

Radiation Induced

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Spatial and spectral oxide trap distributions in power MOSFETs

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858593 ◽

2003 ◽

Cited By ~ 3

Author(s):

A. Torres ◽

O. Flament ◽

C. Marcandella ◽

O. Musseau ◽

J.L. Leray

Keyword(s):

Power Mosfets ◽

Oxide Trap

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Micro-irradiation experiments in MOS transistors using synchrotron radiation

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) ◽

10.1109/radecs.1999.858591 ◽

2003 ◽

Author(s):

J.L. Autran ◽

P. Masson ◽

N. Freud ◽

C. Raynaud ◽

C. Riekel

Keyword(s):

Synchrotron Radiation ◽

Mos Transistors

Download Full-text

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Radiation effects testing at the 88-inch cyclotron

Radiation effects on active pixel sensors

4H-SiC MESFETs behavior after high dose irradiation

Diamond gamma dose rate monitor

Radiation hardening of power MOSFETs using electrical stress

Generation and confinement of mobile charges in buried oxide of SOI substrates

New insights into fully-depleted SOI transistor response after total-dose irradiation

Dynamic testing for radiation induced failures in a standard CMOS submicron technology pixel front-end

Spatial and spectral oxide trap distributions in power MOSFETs

Micro-irradiation experiments in MOS transistors using synchrotron radiation

1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)
Latest Publications