Microbeam and Nanobeam Analysis
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Published By Springer Vienna

9783211828748, 9783709165553
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Monte Carlo Method for Quantitative Analysis of Bulk and Layered Samples

1996 ◽  
pp. 307-316
Author(s):  
Ondrej Gedeon ◽  
Václav Hulínský ◽  
Karel Jurek ◽  
Marta Šimečková
Keyword(s):  
Monte Carlo ◽  
Quantitative Analysis ◽  
Monte Carlo Method ◽  
Layered Samples

Three-Dimensional Nanoanalysis with the Tomographic Atom-Probe

1996 ◽  
pp. 183-194
Author(s):  
Didier Blavette ◽  
Annabelle Bigot ◽  
Cristelle Schmuck ◽  
Frédéric Danoix ◽  
Pierre Auger
Keyword(s):  
Three Dimensional ◽  
Atom Probe ◽  
Tomographic Atom Probe

Calculation of Bremsstrahlung Spectra for Multilayer Samples

1996 ◽  
pp. 453-462
Author(s):  
Arnold Pfeiffer ◽  
Christian Schiebl ◽  
Johann Wernisch

Comparison of Simulated and Experimental Auger Intensities of Au, Pt, Ni and Si in Absolute Units

1996 ◽  
pp. 623-629 ◽  
Author(s):  
Horst W. Wagner ◽  
Christian O. Schiebl ◽  
Wolfgang S. M. Werner

Intensity Measurement of Wavelength Dispersive X-Ray Emission Bands: Applications to the Soft X-Ray Region

1996 ◽  
pp. 61-86
Author(s):  
G. Remond ◽  
C. Gilles ◽  
M. Fialin ◽  
O. Rouer ◽  
R. Marinenko ◽  
...  
Keyword(s):  
Intensity Measurement ◽  
X Ray
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