2008 Symposium on VLSI Technology
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TOTAL DOCUMENTS

80
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H-INDEX

17
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Published By IEEE

9781424418022
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Smallest Vth variability achieved by intrinsic silicon on thin BOX (SOTB) CMOS with single metal gate

2008 ◽  
Author(s):  
Y. Morita ◽  
R. Tsuchiya ◽  
T. Ishigaki ◽  
N. Sugii ◽  
T. Iwamatsu ◽  
...  
Keyword(s):  
Metal Gate

Enhanced endurance of dual-bit SONOS NVM cells using the GIDL read method

2008 ◽  
Author(s):  
Alvaro Padilla ◽  
Sunyeong Lee ◽  
David Carlton ◽  
Tsu-Jae King Liu

Reduction of Vth variation by work function optimization for 45-nm node SRAM cell

2008 ◽  
Author(s):  
G. Tsutsui ◽  
K. Tsunoda ◽  
N. Kariya ◽  
Y. Akiyama ◽  
T. Abe ◽  
...  
Keyword(s):  
Work Function ◽  
Function Optimization ◽  
Sram Cell

Three-dimensional stress engineering in FinFETs for mobility/on-current enhancement and gate current reduction

2008 ◽  
Author(s):  
Masumi Saitoh ◽  
Akio Kaneko ◽  
Kimitoshi Okano ◽  
Tomoko Kinoshita ◽  
Satoshi Inaba ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Gate Current ◽  
Stress Engineering ◽  
Current Reduction

Single metal/single dielectric gate stack realizing triple effective workfunction for embedded memory application

2008 ◽  
Author(s):  
Kenzo Manabe ◽  
Koji Masuzaki ◽  
Takashi Ogura ◽  
Takashi Nakagawa ◽  
Motofumi Saitoh ◽  
...  
Keyword(s):  
Embedded Memory ◽  
Gate Stack

Guidelines to improve mobility performances and BTI reliability of advanced high-k/metal gate stacks

2008 ◽  
Author(s):  
X. Garros ◽  
M. Casse ◽  
G. Reimbold ◽  
F. Martin ◽  
C. Leroux ◽  
...  
Keyword(s):  
Gate Stacks ◽  
Metal Gate ◽  
High K

A novel junction-free BE-SONOS NAND flash

2008 ◽  
Author(s):  
Hang-Ting Lue ◽  
Erh-Kun. Lai ◽  
Y. H. Hsiao ◽  
S. P. Hong ◽  
M. T. Wu ◽  
...  
Keyword(s):  
Nand Flash
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