International Conference on Microelectronic Test Structures, 2003.
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0780376536

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

New evaluation method for reliability of poly-Si thin film transistors using pico-second time-resolved emission microscope

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197457 ◽

2003 ◽

Author(s):

Y. Uraoka ◽

N. Hirai ◽

H. Yano ◽

T. Hatayama ◽

T. Fuyuki

Keyword(s):

Thin Film ◽

Thin Film Transistors ◽

Evaluation Method ◽

Time Resolved ◽

Si Thin Film

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An improved SPICE model for ferroelectric liquid crystal microdisplays

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197438 ◽

2003 ◽

Author(s):

S. Smith ◽

A.J. Walton ◽

I. Underwood ◽

C. Miremont ◽

D.G. Vass ◽

...

Keyword(s):

Liquid Crystal ◽

Ferroelectric Liquid Crystal ◽

Spice Model

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Test time reduction methods for yield test structures

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197384 ◽

2003 ◽

Cited By ~ 4

Author(s):

C. Hess ◽

H. Read ◽

J. Ren ◽

L.H. Weiland ◽

Jianjun Cheng ◽

...

Keyword(s):

Test Time ◽

Test Time Reduction ◽

Yield Test ◽

Reduction Methods ◽

Time Reduction

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Design and integration of electrical-based dimensional process-window checking infrastructure

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197423 ◽

2003 ◽

Cited By ~ 1

Author(s):

K.Y.Y. Doong ◽

R.C.J. Wang ◽

J.C.H. Huang ◽

S.C. Lin ◽

L.J. Hung ◽

...

Keyword(s):

Process Window

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Characterization and modeling of MOSFET mismatch of a deep submicron technology

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197468 ◽

2003 ◽

Cited By ~ 16

Author(s):

M. Quarantelli ◽

S. Saxena ◽

N. Dragone ◽

J.A. Babcock ◽

C. Hess ◽

...

Keyword(s):

Deep Submicron

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The negative capacitance effect on the C-V measurement of ultra thin gate dielectrics induced by the stray capacitance of the measurement system

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197461 ◽

2003 ◽

Cited By ~ 10

Author(s):

Y. Okawa ◽

H. Norimatsu ◽

H. Suto ◽

M. Takayanagi

Keyword(s):

Measurement System ◽

Gate Dielectrics ◽

Negative Capacitance ◽

Stray Capacitance ◽

Capacitance Effect

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Test structure design considerations for RF-CV measurements on leaky dielectrics

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197458 ◽

2003 ◽

Cited By ~ 6

Author(s):

J. Schmitz ◽

F.N. Cubaynes ◽

R.J. Havens ◽

R. de Kort ◽

A.J. Scholten ◽

...

Keyword(s):

Structure Design ◽

Test Structure ◽

Design Considerations ◽

Cv Measurements

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Study on STI mechanical stress induced variations on advanced CMOSFETs

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197462 ◽

2003 ◽

Cited By ~ 6

Author(s):

Y.M. Sheu ◽

K.Y.Y. Doong ◽

C.H. Lee ◽

M.J. Chen ◽

C.H. Diaz

Keyword(s):

Mechanical Stress

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Scalable ground-shielded open fixture applied to de-embedding techniques

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197406 ◽

2003 ◽

Cited By ~ 1

Author(s):

T. Kaija ◽

E. Ristolainen

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Series resistance estimation and C(V) measurements on ultra thin oxide MOS capacitors

International Conference on Microelectronic Test Structures, 2003. ◽

10.1109/icmts.2003.1197460 ◽

2003 ◽

Cited By ~ 7

Author(s):

D. Rideau ◽

P. Scheer ◽

D. Roy ◽

G. Gouget ◽

M. Minondo ◽

...

Keyword(s):

Series Resistance ◽

Mos Capacitors ◽

Thin Oxide

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International Conference on Microelectronic Test Structures, 2003.Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

New evaluation method for reliability of poly-Si thin film transistors using pico-second time-resolved emission microscope

An improved SPICE model for ferroelectric liquid crystal microdisplays

Test time reduction methods for yield test structures

Design and integration of electrical-based dimensional process-window checking infrastructure

Characterization and modeling of MOSFET mismatch of a deep submicron technology

The negative capacitance effect on the C-V measurement of ultra thin gate dielectrics induced by the stray capacitance of the measurement system

Test structure design considerations for RF-CV measurements on leaky dielectrics

Study on STI mechanical stress induced variations on advanced CMOSFETs

Scalable ground-shielded open fixture applied to de-embedding techniques

Series resistance estimation and C(V) measurements on ultra thin oxide MOS capacitors

International Conference on Microelectronic Test Structures, 2003.
Latest Publications