Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference
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Rapid prototyping ATE software with CASE

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270126 ◽

2003 ◽

Author(s):

M.J. Bennett ◽

D.M. Gannon ◽

R.A. Haas ◽

M.J. Halinski

Keyword(s):

Rapid Prototyping

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TPS-X-an automated graphical approach to TPS design

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270115 ◽

2003 ◽

Cited By ~ 3

Author(s):

E.E. Cashar ◽

S.J. Walimaa

Keyword(s):

Graphical Approach

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Evaluating AI-ESTATE standards compliance using a functional intelligence ratio

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270120 ◽

2003 ◽

Author(s):

L.V. Kirkland ◽

J.W. Sheppard ◽

W.R. Simpson

Keyword(s):

Standards Compliance

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Technical certification of test tools/automatic test equipment (ATE)

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270114 ◽

2003 ◽

Cited By ~ 1

Author(s):

D.M. Butler ◽

S. Densler

Keyword(s):

Test Equipment ◽

Automatic Test Equipment ◽

Automatic Test

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The importance of automotive diagnostics in the search of excellence

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270138 ◽

2003 ◽

Author(s):

K. Scott

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ABET-an architecture for integrated diagnostics?

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270105 ◽

2003 ◽

Author(s):

P.M. McCown

Keyword(s):

Integrated Diagnostics

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Expert system for laser vulnerability analysis of aerospace structures

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270129 ◽

2003 ◽

Author(s):

R.V. Grandhi ◽

S.V.L. Chandu ◽

H. Rajagopalan ◽

D. Fautheree

Keyword(s):

Expert System ◽

Vulnerability Analysis ◽

Aerospace Structures

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CASS common ID set cuts TPS costs, eliminates ID redundancy

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270121 ◽

2003 ◽

Author(s):

A. Eiranova ◽

S.J. Mann

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Advanced RF built in test

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270111 ◽

2003 ◽

Cited By ~ 2

Author(s):

D.C. Doskocil

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Fault diagnosis under temporal constraints

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference ◽

10.1109/autest.1992.270119 ◽

2003 ◽

Cited By ~ 4

Author(s):

J.W. Sheppard ◽

W.R. Simpson

Keyword(s):

Fault Diagnosis ◽

Temporal Constraints

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Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Rapid prototyping ATE software with CASE

TPS-X-an automated graphical approach to TPS design

Evaluating AI-ESTATE standards compliance using a functional intelligence ratio

Technical certification of test tools/automatic test equipment (ATE)

The importance of automotive diagnostics in the search of excellence

ABET-an architecture for integrated diagnostics?

Expert system for laser vulnerability analysis of aerospace structures

CASS common ID set cuts TPS costs, eliminates ID redundancy

Advanced RF built in test

Fault diagnosis under temporal constraints

Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference
Latest Publications