Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science
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Published By Springer Berlin Heidelberg

9783642073526, 9783662067239

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_10 ◽

2004 ◽

pp. 249-286 ◽

Cited By ~ 13

Author(s):

N. Armstrong ◽

P. Lynch

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Line Profile Analysis ◽

X Ray ◽

Contrast Factor

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Grain Surface Relaxation Effects in Powder Diffraction

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_16 ◽

2004 ◽

pp. 413-454 ◽

Cited By ~ 13

Author(s):

M. Leoni ◽

P. Scardi

Keyword(s):

Powder Diffraction ◽

Surface Relaxation ◽

Relaxation Effects ◽

Grain Surface

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A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_8 ◽

2004 ◽

pp. 187-227 ◽

Cited By ~ 2

Author(s):

N. Armstrong ◽

W. Kalceff ◽

J. P. Cline ◽

J. Bonevich

Keyword(s):

Reference Material ◽

Maximum Entropy ◽

Standard Reference Material ◽

Maximum Entropy Method ◽

Entropy Method ◽

Bayesian Maximum Entropy ◽

Nanocrystallite Size ◽

Nist Standard Reference Material

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Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_7 ◽

2004 ◽

pp. 167-184 ◽

Cited By ~ 5

Author(s):

P. Riello

Keyword(s):

Quantitative Analysis ◽

Crystalline Materials ◽

Amorphous Fraction

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Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_19 ◽

2004 ◽

pp. 505-526 ◽

Cited By ~ 3

Author(s):

A. Boulle ◽

O. Masson ◽

R. Guinebretière ◽

A. Dauger

Keyword(s):

Epitaxial Layers ◽

Two Dimensional

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Whole Powder Pattern Modelling: Theory and Applications

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_3 ◽

2004 ◽

pp. 51-91 ◽

Cited By ~ 24

Author(s):

P. Scardi ◽

M. Leoni

Keyword(s):

Powder Pattern

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Line Profile Analysis: A Historical Overview

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_1 ◽

2004 ◽

pp. 3-13 ◽

Cited By ~ 4

Author(s):

J. I. Langford

Keyword(s):

Line Profile ◽

Profile Analysis ◽

Line Profile Analysis ◽

Historical Overview

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Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_9 ◽

2004 ◽

pp. 229-245 ◽

Cited By ~ 2

Author(s):

R. Kužel ◽

V. Holý ◽

M. Čerňanský ◽

J. Kubéna ◽

D. Šimek ◽

...

Keyword(s):

Diffuse Scattering ◽

Transmitted Wave ◽

Submicrocrystalline Materials

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Interaction between Phases in Co-deforming Two-Phase Materials: The Role of Dislocation Arrangements

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_15 ◽

2004 ◽

pp. 391-410 ◽

Cited By ~ 3

Author(s):

R. E. Bolmaro ◽

H. G. Brokmeier ◽

J. W. Signorelli ◽

A. Fourty ◽

M. A. Bertinetti

Keyword(s):

Two Phase

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X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science ◽

10.1007/978-3-662-06723-9_11 ◽

2004 ◽

pp. 287-307 ◽

Cited By ~ 1

Author(s):

I. Groma ◽

A. Borbély

Keyword(s):

X Ray ◽

Peak Broadening

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Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials ScienceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Determining the Dislocation Contrast Factor for X-ray Line Profile Analysis

Grain Surface Relaxation Effects in Powder Diffraction

A Bayesian/Maximum Entropy Method for the Certification of a Nanocrystallite-Size NIST Standard Reference Material

Quantitative Analysis of Amorphous Fraction in the Study of the Microstructure of Semi-crystalline Materials

Two-Dimensional XRD Profile Modelling in Imperfect Epitaxial Layers

Whole Powder Pattern Modelling: Theory and Applications

Line Profile Analysis: A Historical Overview

Study of Submicrocrystalline Materials by Diffuse Scattering in Transmitted Wave

Interaction between Phases in Co-deforming Two-Phase Materials: The Role of Dislocation Arrangements

X-ray Peak Broadening Due to Inhomogeneous Dislocation Distributions

Diffraction Analysis of the Microstructure of Materials - Springer Series in Materials Science
Latest Publications