ESSDERC 2008 - 38th European Solid-State Device Research Conference
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 0)

H-INDEX

(FIVE YEARS 0)

Published By IEEE

9781424423637

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Stress enhancement concept on replacement gate technology with top-cut stress liner for nFETs

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681727 ◽

2008 ◽

Cited By ~ 1

Author(s):

S. Yamakawa ◽

S. Mayuzumi ◽

Y. Tateshita ◽

H. Wakabayashi ◽

H. Ansai

Download Full-text

On the RESET-SET transition in Phase Change Memories

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681723 ◽

2008 ◽

Cited By ~ 1

Author(s):

Giuseppina Puzzilli ◽

Fernanda Irrera ◽

Andrea Padovani ◽

Paolo Pavan ◽

Luca Larcher ◽

...

Keyword(s):

Phase Change

Download Full-text

Printed electronics for low-cost electronic systems: Technology status and application development

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681691 ◽

2008 ◽

Cited By ~ 21

Author(s):

Vivek Subramanian ◽

Daniel Soltman ◽

Steven K. Volkman ◽

Qintao Zhang ◽

Josephine B. Chang ◽

...

Keyword(s):

Printed Electronics ◽

Low Cost ◽

Electronic Systems ◽

Application Development

Download Full-text

Experimental and theoretical analysis of hole transport in uniaxially strained pMOSFETs

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681741 ◽

2008 ◽

Cited By ~ 7

Author(s):

K. Huet ◽

C. Tavernier ◽

P. Dollfus ◽

H. Jaouen ◽

M. Feraille ◽

...

Keyword(s):

Theoretical Analysis ◽

Hole Transport

Download Full-text

Impact of the charge transport in the conduction band on the retention of Si-nitride based memories

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681710 ◽

2008 ◽

Cited By ~ 14

Author(s):

E. Vianello ◽

F. Driussi ◽

P. Palestri ◽

A. Arreghini ◽

D. Esseni ◽

...

Keyword(s):

Charge Transport ◽

Conduction Band

Download Full-text

A power-efficient impoved-stability 6T SRAM cell in 45nm Multi-Channel FET technology

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681721 ◽

2008 ◽

Cited By ~ 1

Author(s):

Olivier Thomas ◽

Bernard Guillaumot ◽

Thomas Ernst ◽

Bastien Cousin ◽

Olivier Rozeau

Keyword(s):

Power Efficient ◽

Sram Cell

Download Full-text

Advantage of La2O3 gate dielectric over HfO2 for direct contact and mobility improvment

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681715 ◽

2008 ◽

Cited By ~ 2

Author(s):

K. Kakushima ◽

K. Tachi ◽

M. Adachi ◽

K. Okamoto ◽

S. Sato ◽

...

Keyword(s):

Direct Contact ◽

Gate Dielectric

Download Full-text

Solving issues of integrated circuits by 3D-stacking Meeting with the era of power, integrity attackers and NRE explosion and a bit of future

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681690 ◽

2008 ◽

Cited By ~ 1

Author(s):

Takayasu Sakurai

Keyword(s):

Integrated Circuits ◽

Power Integrity ◽

3D Stacking

Download Full-text

Improved analog performance of strained Si n-MOSFETs on thin SiGe strained relaxed buffers

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681708 ◽

2008 ◽

Cited By ~ 2

Author(s):

O.M. Alatise ◽

K.S.K. Kwa ◽

S.H. Olsen ◽

A.G. O'Neill

Keyword(s):

Strained Si ◽

Analog Performance

Download Full-text

100 kframe/s 8 bit monolithic single-photon imagers

ESSDERC 2008 - 38th European Solid-State Device Research Conference ◽

10.1109/essderc.2008.4681751 ◽

2008 ◽

Cited By ~ 3

Author(s):

Simone Tisa ◽

Fabrizio Guerrieri ◽

Alberto Tosi ◽

Franco Zappa

Keyword(s):

Single Photon

Download Full-text

ESSDERC 2008 - 38th European Solid-State Device Research ConferenceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Stress enhancement concept on replacement gate technology with top-cut stress liner for nFETs

On the RESET-SET transition in Phase Change Memories

Printed electronics for low-cost electronic systems: Technology status and application development

Experimental and theoretical analysis of hole transport in uniaxially strained pMOSFETs

Impact of the charge transport in the conduction band on the retention of Si-nitride based memories

A power-efficient impoved-stability 6T SRAM cell in 45nm Multi-Channel FET technology

Advantage of La2O3 gate dielectric over HfO2 for direct contact and mobility improvment

Solving issues of integrated circuits by 3D-stacking Meeting with the era of power, integrity attackers and NRE explosion and a bit of future

Improved analog performance of strained Si n-MOSFETs on thin SiGe strained relaxed buffers

100 kframe/s 8 bit monolithic single-photon imagers

ESSDERC 2008 - 38th European Solid-State Device Research Conference
Latest Publications