Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III)
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Published By Springer Berlin Heidelberg

9783642827204, 9783642827181

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Surface Organic Reactions Induced by Ion Bombardment

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_6 ◽

1986 ◽

pp. 28-33 ◽

Cited By ~ 3

Author(s):

R. G. Cooks ◽

B.-H. Hsu ◽

W. B. Emary ◽

W. K. Fife

Keyword(s):

Ion Bombardment ◽

Organic Reactions

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Laser Desorption Fourier Transform Mass Spectrometry: Mechanisms of Desorption and Analytical Applications

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_38 ◽

1986 ◽

pp. 204-208 ◽

Cited By ~ 1

Author(s):

M. P. Chiarelli ◽

D. A. McCrery ◽

M. L. Gross

Keyword(s):

Mass Spectrometry ◽

Fourier Transform ◽

Fourier Transform Mass Spectrometry ◽

Laser Desorption ◽

Analytical Applications

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The Chemical Ionization/Particle-Induced Ion Source

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_34 ◽

1986 ◽

pp. 179-183

Author(s):

R. B. Freas ◽

J. E. Campana

Keyword(s):

Chemical Ionization ◽

Ion Source

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On Different Desorption Modes in LDMS

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_30 ◽

1986 ◽

pp. 158-162

Author(s):

B. Lindner ◽

U. Seydel

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On the Charge-State Dependence of Secondary Ion Emission from Phenylalanine

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_3 ◽

1986 ◽

pp. 11-16 ◽

Cited By ~ 2

Author(s):

O. Becker ◽

W. Guthier ◽

K. Wien ◽

S. Della-Negra ◽

Y. le Beyec ◽

...

Keyword(s):

Charge State ◽

State Dependence ◽

Secondary Ion Emission ◽

Ion Emission ◽

Secondary Ion

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Secondary Ion Emission from Glycerol and Silver Supported Organic Molecules

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_19 ◽

1986 ◽

pp. 96-101 ◽

Cited By ~ 1

Author(s):

M. Junack ◽

W. Sichtermann ◽

A. Benninghoven

Keyword(s):

Organic Molecules ◽

Secondary Ion Emission ◽

Ion Emission ◽

Secondary Ion

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Analytical Applications of High-Performance TOF-SIMS

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_14 ◽

1986 ◽

pp. 67-73 ◽

Cited By ~ 1

Author(s):

W. Lange ◽

D. Greifendorf ◽

D. van Leyen ◽

E. Niehuis ◽

A. Benninghoven

Keyword(s):

High Performance ◽

Tof Sims ◽

Analytical Applications

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Secondary Ion Formation Processes in Amino Acid — Metal Adsorption Systems

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_13 ◽

1986 ◽

pp. 62-66 ◽

Cited By ~ 1

Author(s):

D. Holtkamp ◽

M. Kempken ◽

P. Klüsener ◽

A. Benninghoven

Keyword(s):

Amino Acid ◽

Metal Adsorption ◽

Formation Processes ◽

Ion Formation ◽

Secondary Ion ◽

Adsorption Systems

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Aspects and Applications of Derivatization/SIMS

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_11 ◽

1986 ◽

pp. 51-55 ◽

Cited By ~ 2

Author(s):

M. M. Ross ◽

J. E. Campana ◽

R. J. Colton ◽

D. A. Kidwell

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Application of Secondary Ion Mass Spectrometry Combined with Fourier Transform Ion Cyclotron Resonance

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III) ◽

10.1007/978-3-642-82718-1_40 ◽

1986 ◽

pp. 213-217 ◽

Cited By ~ 1

Author(s):

S. Plesko ◽

P. Grossmann ◽

M. Allemann ◽

H. P. Kellerhals

Keyword(s):

Mass Spectrometry ◽

Fourier Transform ◽

Cyclotron Resonance ◽

Secondary Ion Mass Spectrometry ◽

Ion Cyclotron Resonance ◽

Ion Cyclotron ◽

Ion Mass Spectrometry ◽

Secondary Ion

Download Full-text

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Surface Organic Reactions Induced by Ion Bombardment

Laser Desorption Fourier Transform Mass Spectrometry: Mechanisms of Desorption and Analytical Applications

The Chemical Ionization/Particle-Induced Ion Source

On Different Desorption Modes in LDMS

On the Charge-State Dependence of Secondary Ion Emission from Phenylalanine

Secondary Ion Emission from Glycerol and Silver Supported Organic Molecules

Analytical Applications of High-Performance TOF-SIMS

Secondary Ion Formation Processes in Amino Acid — Metal Adsorption Systems

Aspects and Applications of Derivatization/SIMS

Application of Secondary Ion Mass Spectrometry Combined with Fourier Transform Ion Cyclotron Resonance

Springer Proceedings in Physics - Ion Formation from Organic Solids (IFOS III)
Latest Publications