2009 15th IEEE International On-Line Testing Symposium
Latest Publications

TOTAL DOCUMENTS

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Published By IEEE

9781424445967

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

C-testable S-box implementation for secure advanced encryption standard

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5196017 ◽

2009 ◽

Cited By ~ 1

Author(s):

H. Rahaman ◽

J. Mathew ◽

A. Jabir ◽

D. K. Pradhan

Keyword(s):

Advanced Encryption Standard

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ATPG-based grading of strong fault-secureness

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5196027 ◽

2009 ◽

Cited By ~ 13

Author(s):

Marc Hunger ◽

Sybille Hellebrand ◽

Alejandro Czutro ◽

Ilia Polian ◽

Bernd Becker

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Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5195984 ◽

2009 ◽

Cited By ~ 29

Author(s):

Caroline Concatto ◽

Pedro Almeida ◽

Fernanda Kastensmidt ◽

Erika Cota ◽

Marcelo Lubaszewski ◽

...

Keyword(s):

Fault Diagnosis

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Fault injection-based evaluation of a synchronous NoC router

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5196018 ◽

2009 ◽

Cited By ~ 6

Author(s):

Ashkan Eghbal ◽

Pooria M. Yaghini ◽

Hossein Pedram ◽

Hamid R. Zarandi

Keyword(s):

Fault Injection

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Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5195994 ◽

2009 ◽

Author(s):

Abhijit Chatterjee ◽

Jacob Abraham ◽

Adit Singh ◽

Elie Maricau ◽

Rakesh Kumar ◽

...

Keyword(s):

Process Control ◽

Low Power ◽

Low Power Design

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Nonlinear compression functions using the MISR approach for security purposes in automotive applications

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5195983 ◽

2009 ◽

Cited By ~ 4

Author(s):

Eberhard Bohl ◽

Paul Duplys

Keyword(s):

Automotive Applications ◽

Nonlinear Compression

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Enhanced self-configurability and yield in multicore grids

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5195986 ◽

2009 ◽

Cited By ~ 3

Author(s):

E. Kolonis ◽

M. Nicolaidis ◽

D. Gizopoulos ◽

M. Psarakis ◽

J.H. Collet ◽

...

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Designing dependable multicore system with unreliable components

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5195999 ◽

2009 ◽

Cited By ~ 1

Author(s):

Vikas Chandra

Keyword(s):

Multicore System

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Controllability and observability in mixed signal cores

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5196012 ◽

2009 ◽

Cited By ~ 1

Author(s):

Jose Rocha ◽

Nuno Dias ◽

Angelo Monteiro ◽

Alexandre Neves ◽

Gabriel Santos ◽

...

Keyword(s):

Mixed Signal ◽

Controllability And Observability

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An Input Vector Monitoring Concurrent BIST scheme exploiting “X” values

2009 15th IEEE International On-Line Testing Symposium ◽

10.1109/iolts.2009.5196015 ◽

2009 ◽

Cited By ~ 4

Author(s):

I. Voyiatzis ◽

D. Gizopoulos ◽

A. Paschalis

Keyword(s):

Input Vector

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2009 15th IEEE International On-Line Testing SymposiumLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

C-testable S-box implementation for secure advanced encryption standard

ATPG-based grading of strong fault-secureness

Improving yield of torus nocs through fault-diagnosis-and-repair of interconnect faults

Fault injection-based evaluation of a synchronous NoC router

Panel: Realistic low power design: Let errors occur and correct them later or mitigate errors via design guardbanding and process control?

Nonlinear compression functions using the MISR approach for security purposes in automotive applications

Enhanced self-configurability and yield in multicore grids

Designing dependable multicore system with unreliable components

Controllability and observability in mixed signal cores

An Input Vector Monitoring Concurrent BIST scheme exploiting “X” values

2009 15th IEEE International On-Line Testing Symposium
Latest Publications