2016 87th ARFTG Microwave Measurement Conference (ARFTG)
Latest Publications

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Published By IEEE

9781509013081

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501953 ◽

2016 ◽

Cited By ~ 1

Author(s):

Gianni Bosi ◽

Antonio Raffo ◽

Gustavo Avolio ◽

Dominique Schreurs ◽

David A. Humphreys

Keyword(s):

Measurement Uncertainty ◽

Microwave Measurement ◽

Nonlinear Embedding

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Technical program committee

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501938 ◽

2016 ◽

Keyword(s):

Program Committee ◽

Technical Program Committee ◽

Technical Program

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Supply-terminal 40 MHz BW characterization of impedance-like nonlinear functions for envelope tracking PAs

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501958 ◽

2016 ◽

Cited By ~ 5

Author(s):

Gian Piero Gibiino ◽

Julien Couvidat ◽

Gustavo Avolio ◽

Dominique Schreurs ◽

Alberto Santarelli

Keyword(s):

Nonlinear Functions ◽

Envelope Tracking

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W-band passive load pull system for on-wafer characterization of high power density N-polar GaN devices based on output match and drive power requirements vs. gate width

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501955 ◽

2016 ◽

Cited By ~ 5

Author(s):

Matthew Guidry ◽

Steven Wienecke ◽

Brian Romanczyk ◽

Xun Zheng ◽

Haoran Li ◽

...

Keyword(s):

Power Density ◽

High Power ◽

High Power Density ◽

Drive Power ◽

Gate Width ◽

Pull System ◽

W Band ◽

Load Pull

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Traceable calibration with 1.0mm coaxial standards

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501943 ◽

2016 ◽

Cited By ~ 1

Author(s):

J. Hoffmann ◽

M. Wollensack ◽

J. Ruefenacht ◽

D. Stalder ◽

M. Zeier

Keyword(s):

Traceable Calibration

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Wideband RF characterization setup with high dynamic range low frequency measurement capabilities

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501956 ◽

2016 ◽

Cited By ~ 4

Author(s):

Sebastian Gustafsson ◽

Christian Fager ◽

Koen Buisman ◽

Mattias Thorsell

Keyword(s):

Dynamic Range ◽

Low Frequency ◽

High Dynamic Range ◽

Frequency Measurement ◽

High Dynamic ◽

Measurement Capabilities

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A study of the reference impedance influence on a TRL calibration

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501969 ◽

2016 ◽

Cited By ~ 1

Author(s):

Karsten Kuhlmann

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Verification of a foundry-developed transistor model including measurement uncertainty

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501952 ◽

2016 ◽

Cited By ~ 3

Author(s):

Dylan Williams ◽

Wei Zhao ◽

Richard A. Chamberlin ◽

Jerome Cheron ◽

Miguel Urteaga

Keyword(s):

Measurement Uncertainty ◽

Transistor Model

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[Front cover]

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501937 ◽

2016 ◽

Keyword(s):

Front Cover

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Importance and measurement of phase-stiffness in RF switching amplifiers

2016 87th ARFTG Microwave Measurement Conference (ARFTG) ◽

10.1109/arftg.2016.7501948 ◽

2016 ◽

Cited By ~ 2

Author(s):

Dubravko Babic ◽

Earl McCune ◽

Waclaw Godycki ◽

Quentin Diduck ◽

Douglas Kirkpatrick

Keyword(s):

Switching Amplifiers

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2016 87th ARFTG Microwave Measurement Conference (ARFTG)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Impact of microwave measurement uncertainty on the Nonlinear Embedding procedure

Technical program committee

Supply-terminal 40 MHz BW characterization of impedance-like nonlinear functions for envelope tracking PAs

W-band passive load pull system for on-wafer characterization of high power density N-polar GaN devices based on output match and drive power requirements vs. gate width

Traceable calibration with 1.0mm coaxial standards

Wideband RF characterization setup with high dynamic range low frequency measurement capabilities

A study of the reference impedance influence on a TRL calibration

Verification of a foundry-developed transistor model including measurement uncertainty

[Front cover]

Importance and measurement of phase-stiffness in RF switching amplifiers

2016 87th ARFTG Microwave Measurement Conference (ARFTG)
Latest Publications