2008 European Conference on Radiation and Its Effects on Components and Systems
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H-INDEX

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Published By IEEE

9781457704819

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Official reviewers

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782673 ◽

2008 ◽

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Pulsed Laser SEU Cross-Section measurement using coincidence detectors

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782701 ◽

2008 ◽

Author(s):

F.R. Palomo ◽

J.M. Mogollon ◽

J. Napoles ◽

H. Guzman-Miranda ◽

A.P. Vega-Leal ◽

...

Keyword(s):

Cross Section ◽

Pulsed Laser ◽

Cross Section Measurement ◽

Section Measurement

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Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782758 ◽

2008 ◽

Author(s):

Alessio Griffoni ◽

Marco Silvestri ◽

Simone Gerardin ◽

Gaudenzio Meneghesso ◽

Alessandro Paccagnella ◽

...

Keyword(s):

Deep Submicron ◽

X Rays ◽

Dose Enhancement

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A new technique for SET pulse width measurement in chains of inverters using pulsed laser irradiation

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782706 ◽

2008 ◽

Author(s):

V. Ferlet-Cavrois ◽

D. McMorrow ◽

D. Kobayashi ◽

N. Fel ◽

J. S. Melinger ◽

...

Keyword(s):

Laser Irradiation ◽

Pulse Width ◽

Pulsed Laser ◽

New Technique ◽

Width Measurement ◽

A New Technique ◽

Pulsed Laser Irradiation

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A 3-D simulation study about Single Event Gate damage in medium voltage power MOSFET

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782713 ◽

2008 ◽

Cited By ~ 4

Author(s):

A. Porzio ◽

F. Velardi ◽

G. Busatto ◽

F. Iannuzzo ◽

A. Sanseverino ◽

...

Keyword(s):

Simulation Study ◽

Single Event ◽

Power Mosfet ◽

Medium Voltage

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RADECS 2008 Awards

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782674 ◽

2008 ◽

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Recent progress in CERN RD39: radiation hard cryogenic silicon detectors for applications in LHC experiments and their future upgrades

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782733 ◽

2008 ◽

Author(s):

E. Tuominen ◽

P. Anbinderis ◽

T. Anbinderis ◽

R. Bates ◽

W. de Boer ◽

...

Keyword(s):

Recent Progress ◽

Silicon Detectors ◽

Radiation Hard

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Proton radiation test of DC/DC converter with high voltage output

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782686 ◽

2008 ◽

Author(s):

St. Scherrer ◽

W. Hajdas ◽

U. Grossner ◽

N. Schlumpf

Keyword(s):

High Voltage ◽

Proton Radiation ◽

Voltage Output ◽

Radiation Test

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Altitude and underground real-time SER characterization of CMOS 65nm SRAM

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782774 ◽

2008 ◽

Cited By ~ 1

Author(s):

J.L. Autran ◽

P. Roche ◽

S. Sauze ◽

G. Gasiot ◽

D. Munteanu ◽

...

Keyword(s):

Real Time

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Design, assessment and modeling of an integrated 0.4 µm SiGe Bipolar VCSEL driver under γ-radiation

2008 European Conference on Radiation and Its Effects on Components and Systems ◽

10.1109/radecs.2008.5782683 ◽

2008 ◽

Cited By ~ 2

Author(s):

P. Leroux ◽

W. De Cock ◽

M. Van Uffelen ◽

M. Steyaert

Keyword(s):

Design Assessment

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2008 European Conference on Radiation and Its Effects on Components and SystemsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Official reviewers

Pulsed Laser SEU Cross-Section measurement using coincidence detectors

Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays

A new technique for SET pulse width measurement in chains of inverters using pulsed laser irradiation

A 3-D simulation study about Single Event Gate damage in medium voltage power MOSFET

RADECS 2008 Awards

Recent progress in CERN RD39: radiation hard cryogenic silicon detectors for applications in LHC experiments and their future upgrades

Proton radiation test of DC/DC converter with high voltage output

Altitude and underground real-time SER characterization of CMOS 65nm SRAM

Design, assessment and modeling of an integrated 0.4 µm SiGe Bipolar VCSEL driver under γ-radiation

2008 European Conference on Radiation and Its Effects on Components and Systems
Latest Publications