2015 IEEE East-West Design & Test Symposium (EWDTS)
Latest Publications

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Published By IEEE

9781467377768

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Cell library for speed-independent VLSI

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493111 ◽

2015 ◽

Cited By ~ 1

Author(s):

Y. A. Stepchenkov ◽

V. N. Zakharov ◽

Y. G. Diachenko ◽

N. V. Morozov ◽

D. Y. Stepchenkov

Keyword(s):

Cell Library

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Fully delay and multiple stuck-at faults testable FSM design

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493105 ◽

2015 ◽

Cited By ~ 1

Author(s):

A. Matrosova ◽

V. Andreeva ◽

V. Tomkov

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Secure environment establishment for FPGA-based safety-critical systems

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493162 ◽

2015 ◽

Cited By ~ 1

Author(s):

Vyacheslav Kharchenko ◽

Andriy Kovalenko ◽

Vladimir Sklyar

Keyword(s):

Critical Systems ◽

Safety Critical ◽

Secure Environment ◽

Safety Critical Systems

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Functional approach in self-timed circuit design

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493124 ◽

2015 ◽

Author(s):

L. P. Plekhanov ◽

V. N. Zakharov ◽

Y. A. Stepchenkov

Keyword(s):

Circuit Design ◽

Functional Approach

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A resource approach to on-line testing of computing circuits

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493122 ◽

2015 ◽

Cited By ~ 6

Author(s):

J. Drozd ◽

A. Drozd ◽

M. Al-dhabi

Keyword(s):

On Line

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Real-time state-of-energy estimation of supercapacitor-based energy storage

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493168 ◽

2015 ◽

Cited By ~ 1

Author(s):

Noam Reichbach ◽

Sergei Kolesnik ◽

Alon Kuperman

Keyword(s):

Energy Storage ◽

Real Time ◽

Energy Estimation

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An automated technique for design of custom Network-on-Chip topologies

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493139 ◽

2015 ◽

Cited By ~ 1

Author(s):

S. O. Bykov ◽

S. G. Mosin

Keyword(s):

Network On Chip ◽

Automated Technique ◽

On Chip

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[Copyright notice]

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493184 ◽

2015 ◽

Keyword(s):

Download Full-text

Quality improvement of analog circuits fault diagnosis based on ANN using clusterization as preprocessing

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493158 ◽

2015 ◽

Cited By ~ 1

Author(s):

Sergey Mosin

Keyword(s):

Quality Improvement ◽

Fault Diagnosis ◽

Analog Circuits

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Modeling transistor level masking of soft errors in combinational circuits

2015 IEEE East-West Design & Test Symposium (EWDTS) ◽

10.1109/ewdts.2015.7493140 ◽

2015 ◽

Author(s):

Ihsen Alouani ◽

Smail Niar ◽

Yassin El-Hillali ◽

Atika Rivenq-Menhaj

Keyword(s):

Soft Errors ◽

Combinational Circuits

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2015 IEEE East-West Design & Test Symposium (EWDTS)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Cell library for speed-independent VLSI

Fully delay and multiple stuck-at faults testable FSM design

Secure environment establishment for FPGA-based safety-critical systems

Functional approach in self-timed circuit design

A resource approach to on-line testing of computing circuits

Real-time state-of-energy estimation of supercapacitor-based energy storage

An automated technique for design of custom Network-on-Chip topologies

[Copyright notice]

Quality improvement of analog circuits fault diagnosis based on ANN using clusterization as preprocessing

Modeling transistor level masking of soft errors in combinational circuits

2015 IEEE East-West Design & Test Symposium (EWDTS)
Latest Publications