Kelvin Probe Force Microscopy - Springer Series in Surface Sciences
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Published By Springer Berlin Heidelberg

9783642225659, 9783642225666

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

KPFM and PFM of Biological Systems

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_12 ◽

2011 ◽

pp. 243-287 ◽

Cited By ~ 6

Author(s):

B. J. Rodriguez ◽

S. V. Kalinin

Keyword(s):

Biological Systems

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Experimental Technique and Working Modes

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_2 ◽

2011 ◽

pp. 7-24 ◽

Cited By ~ 10

Author(s):

S. Sadewasser

Keyword(s):

Experimental Technique

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Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_5 ◽

2011 ◽

pp. 69-97

Author(s):

Laurent Nony ◽

Franck Bocquet ◽

Adam S. Foster ◽

Christian Loppacher

Keyword(s):

Numerical Approach ◽

Kelvin Probe Force Microscopy ◽

Atomic Scale ◽

Kelvin Probe ◽

Force Microscopy

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Local Work Function of Catalysts and Photoelectrodes

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_10 ◽

2011 ◽

pp. 201-219 ◽

Cited By ~ 1

Author(s):

H. Onishi ◽

A. Sasahara

Keyword(s):

Work Function ◽

Local Work

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Measuring Atomic-Scale Variations of the Electrostatic Force

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_13 ◽

2011 ◽

pp. 289-327 ◽

Cited By ~ 2

Author(s):

Th. Glatzel

Keyword(s):

Electrostatic Force ◽

Atomic Scale

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The Effect of the Measuring Tip and Image Reconstruction

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_4 ◽

2011 ◽

pp. 45-67

Author(s):

Y. Rosenwaks ◽

G. Elias ◽

E. Strassbourg ◽

A. Schwarzman ◽

A. Boag

Keyword(s):

Image Reconstruction

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Optoelectronic Studies of Solar Cells

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_8 ◽

2011 ◽

pp. 151-174

Author(s):

S. Sadewasser

Keyword(s):

Solar Cells

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Introduction

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_1 ◽

2011 ◽

pp. 1-3 ◽

Cited By ~ 1

Author(s):

S. Sadewasser ◽

Th. Glatzel

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Surface Properties of Nanostructures Supported on Semiconductor Substrates

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_7 ◽

2011 ◽

pp. 117-149

Author(s):

F. Krok ◽

J. Konior ◽

M. Szymonski

Keyword(s):

Surface Properties ◽

Semiconductor Substrates

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Electronic Properties of Metal/Organic Interfaces

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences ◽

10.1007/978-3-642-22566-6_11 ◽

2011 ◽

pp. 221-241

Author(s):

Christian Loppacher

Keyword(s):

Electronic Properties ◽

Organic Interfaces ◽

Metal Organic

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Kelvin Probe Force Microscopy - Springer Series in Surface SciencesLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

KPFM and PFM of Biological Systems

Experimental Technique and Working Modes

Contribution of the Numerical Approach to Kelvin Probe Force Microscopy on the Atomic-Scale

Local Work Function of Catalysts and Photoelectrodes

Measuring Atomic-Scale Variations of the Electrostatic Force

The Effect of the Measuring Tip and Image Reconstruction

Optoelectronic Studies of Solar Cells

Introduction

Surface Properties of Nanostructures Supported on Semiconductor Substrates

Electronic Properties of Metal/Organic Interfaces

Kelvin Probe Force Microscopy - Springer Series in Surface Sciences
Latest Publications