Testability Concepts for Digital ICs - Frontiers in Electronic Testing
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9781461360049, 9781461523659
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Examples of Leaf-Macro Test Techniques

1995 ◽  
pp. 41-79
Author(s):  
F. P. M. Beenker ◽  
R. G. Bennetts ◽  
A. P. Thijssen

Macro Test: A Framework for Testable IC Design

1995 ◽  
pp. 19-40
Author(s):  
F. P. M. Beenker ◽  
R. G. Bennetts ◽  
A. P. Thijssen
Keyword(s):  
Ic Design

Defect-Oriented Testing

1995 ◽  
pp. 9-17
Author(s):  
F. P. M. Beenker ◽  
R. G. Bennetts ◽  
A. P. Thijssen

Test Control Block Concepts

1995 ◽  
pp. 107-138
Author(s):  
F. P. M. Beenker ◽  
R. G. Bennetts ◽  
A. P. Thijssen
Keyword(s):  
Control Block ◽  
Test Control

Exploiting Parallelism in Leaf-Macro Access

1995 ◽  
pp. 139-169
Author(s):  
F. P. M. Beenker ◽  
R. G. Bennetts ◽  
A. P. Thijssen

Introduction

1995 ◽  
pp. 1-8 ◽  
Author(s):  
F. P. M. Beenker ◽  
R. G. Bennetts ◽  
A. P. Thijssen

Timing Aspects of CMOS VLSI Circuits

1995 ◽  
pp. 171-191
Author(s):  
F. P. M. Beenker ◽  
R. G. Bennetts ◽  
A. P. Thijssen
Keyword(s):  
Vlsi Circuits ◽  
Cmos Vlsi
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