2019 IEEE International Test Conference (ITC)
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73
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Published By IEEE

9781728148236
Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Is Backside the New Backdoor in Modern SoCs?: Invited Paper

2019 ◽  
Author(s):  
Nidish Vashistha ◽  
M Tanjidur Rahman ◽  
Olivia P. Paradis ◽  
Navid Asadizanjani

Resiliency of automotive object detection networks on GPU architectures

2019 ◽  
Author(s):  
Atieh Lotfi ◽  
Saurabh Hukerikar ◽  
Keshav Balasubramanian ◽  
Paul Racunas ◽  
Nirmal Saxena ◽  
...  
Keyword(s):  
Object Detection ◽  
Gpu Architectures

Applications of Hierarchical Test

2019 ◽  
Author(s):  
Kelly Ockunzzi ◽  
Richard Grupp ◽  
Brion Keller ◽  
Mark Taylor ◽  
Sreekanth Pai ◽  
...  

International Symposium on Design and Diagnostics of Electronic Circuits and Systems

2019 ◽  
Author(s):  
Zoran Stamenkovic ◽  
Alberto Bosio ◽  
Gyorgy Cserey ◽  
Ondrej Novak ◽  
Witold Pleskacz ◽  
...  
Keyword(s):  
International Symposium ◽  
Electronic Circuits
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