Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization
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9780127521459

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Chapter 6 Studies of the Stripping Hall Effect in Ion-Implanted Silicon

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62678-2 ◽

1997 ◽

pp. 165-194

Author(s):

M.L. Polignano ◽

G. Queirolo

Keyword(s):

Hall Effect ◽

Ion Implanted

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Volume Editors

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62668-x ◽

1997 ◽

pp. iii

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List of Contributors

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62670-8 ◽

1997 ◽

pp. xi-xii

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Chapter 4 Ion Beams in Amorphous Semiconductor Research

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62676-9 ◽

1997 ◽

pp. 85-127

Author(s):

G. Mütter ◽

S. Kalbitzer ◽

G.N. Greaves

Keyword(s):

Ion Beams ◽

Amorphous Semiconductor

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Chapter 7 Transmission Electron Microscopy Analyses

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62679-4 ◽

1997 ◽

pp. 195-238

Author(s):

J. Stoemenos

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Transmission Electron

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Chapter 8 Rutherford Backscattering Studies of Ion Implanted Semiconductors

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62680-0 ◽

1997 ◽

pp. 239-260 ◽

Cited By ~ 1

Author(s):

Roberta Nipoti ◽

Marco Servidori

Keyword(s):

Rutherford Backscattering ◽

Ion Implanted

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Chapter 5 Sheet and Spreading Resistance Analysis of Ion Implanted and Annealed Semiconductors

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62677-0 ◽

1997 ◽

pp. 129-163 ◽

Cited By ~ 1

Author(s):

Jumana Boussey-Said

Keyword(s):

Spreading Resistance ◽

Resistance Analysis ◽

Ion Implanted

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Chapter 9 X-Ray Diffraction Techniques

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62681-2 ◽

1997 ◽

pp. 261-282

Author(s):

P. Zaumseil

Keyword(s):

X Ray Diffraction ◽

X Ray

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Index

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62682-4 ◽

1997 ◽

pp. 283-286

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Preface

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization ◽

10.1016/s0080-8784(08)62672-1 ◽

1997 ◽

pp. xvii-xix

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Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical CharacterizationLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Elsevier

Chapter 6 Studies of the Stripping Hall Effect in Ion-Implanted Silicon

Volume Editors

List of Contributors

Chapter 4 Ion Beams in Amorphous Semiconductor Research

Chapter 7 Transmission Electron Microscopy Analyses

Chapter 8 Rutherford Backscattering Studies of Ion Implanted Semiconductors

Chapter 5 Sheet and Spreading Resistance Analysis of Ion Implanted and Annealed Semiconductors

Chapter 9 X-Ray Diffraction Techniques

Index

Preface

Semiconductors and Semimetals - Effect of Disorder and Defects in Ion-Implanted Semiconductors: Electrical and Physicochemical Characterization
Latest Publications