Advances in Imaging and Electron Physics
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10

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3

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Published By Elsevier

9780120147526

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Edited by

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70202-7 ◽

1999 ◽

pp. iii

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Index

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70210-6 ◽

1999 ◽

pp. 173-178

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Difference in the Aharonov–Bohm Effect on Scattering States and Bound States

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70209-x ◽

1999 ◽

pp. 101-171 ◽

Cited By ~ 3

Author(s):

Seiji Sakoda ◽

Minoru Omote

Keyword(s):

Bound States ◽

Scattering States ◽

Bohm Effect ◽

Aharonov Bohm

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Editor-in-Chief

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70201-5 ◽

1999 ◽

pp. ii

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High-Speed Electron Microscopy

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70207-6 ◽

1999 ◽

pp. 21-61 ◽

Cited By ~ 2

Author(s):

O. Bostanjoglo

Keyword(s):

Electron Microscopy ◽

High Speed

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Copyright page

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70203-9 ◽

1999 ◽

pp. iv

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Preface

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70205-2 ◽

1999 ◽

pp. ix-x

Author(s):

Peter W. Hawkes

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Soft Mathematical Morphology: Extensions, Algorithms, and Implementations

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70208-8 ◽

1999 ◽

pp. 63-99 ◽

Cited By ~ 5

Author(s):

A. Gasteratos ◽

I. Andreadis

Keyword(s):

Mathematical Morphology

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Contributors

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70204-0 ◽

1999 ◽

pp. vii

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Interference Scanning Optical Probe Microscopy: Principles and Applications

Advances in Imaging and Electron Physics ◽

10.1016/s1076-5670(08)70206-4 ◽

1999 ◽

pp. 1-19 ◽

Cited By ~ 3

Author(s):

W.S. Bacsa

Keyword(s):

Optical Probe ◽

Probe Microscopy

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