Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
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Published By Springer US

9781461407874, 9781461407881

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Stochastic Analog Mismatch Analysis

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_15 ◽

2012 ◽

pp. 235-252

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Stochastic Analog

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Incremental Extraction of Variational Capacitance

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_12 ◽

2012 ◽

pp. 183-208

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

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Introduction

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_1 ◽

2012 ◽

pp. 3-14

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

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Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_9 ◽

2012 ◽

pp. 127-144

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Statistical Power ◽

Krylov Subspace ◽

Power Grid ◽

Krylov Subspace Method ◽

Subspace Method ◽

Grid Analysis

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Traditional Statistical Leakage Power Analysis Methods

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_3 ◽

2012 ◽

pp. 39-54

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Power Analysis ◽

Leakage Power ◽

Analysis Methods

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Fundamentals of Statistical Analysis

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_2 ◽

2012 ◽

pp. 15-36

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Statistical Analysis

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Statistical Dynamic Power Estimation Techniques

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_6 ◽

2012 ◽

pp. 83-92

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Power Estimation ◽

Estimation Techniques ◽

Dynamic Power ◽

Statistical Dynamic

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Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_5 ◽

2012 ◽

pp. 65-82

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Virtual Grid ◽

Grid Based

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Voltage Binning Technique for Yield Optimization

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_17 ◽

2012 ◽

pp. 273-286

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Yield Optimization

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Performance Bound Analysis of Variational Linearized Analog Circuits

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs ◽

10.1007/978-1-4614-0788-1_14 ◽

2012 ◽

pp. 221-233

Author(s):

Ruijing Shen ◽

Sheldon X.-D. Tan ◽

Hao Yu

Keyword(s):

Analog Circuits ◽

Performance Bound ◽

Bound Analysis

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Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI DesignsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer US

Stochastic Analog Mismatch Analysis

Incremental Extraction of Variational Capacitance

Introduction

Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method

Traditional Statistical Leakage Power Analysis Methods

Fundamentals of Statistical Analysis

Statistical Dynamic Power Estimation Techniques

Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling

Voltage Binning Technique for Yield Optimization

Performance Bound Analysis of Variational Linearized Analog Circuits

Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs
Latest Publications