2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
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9781467330213, 9781467330206, 9781467330190

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Call for papers

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352629 ◽

2012 ◽

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Best practices to ensure the stability of sige HBT cascode low noise amplifiers

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352657 ◽

2012 ◽

Cited By ~ 14

Author(s):

Robert L. Schmid ◽

Christopher T. Coen ◽

Subramaniam Shankar ◽

John D. Cressler

Keyword(s):

Best Practices ◽

Low Noise ◽

Low Noise Amplifiers ◽

Sige Hbt ◽

The Stability

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Extrinsic base resistance optimization in DPSA-SEG SiGe:C HBTs

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352650 ◽

2012 ◽

Cited By ~ 3

Author(s):

E. Canderle ◽

P. Chevalier ◽

A. Montagne ◽

L. Moynet ◽

G. Avenier ◽

...

Keyword(s):

Base Resistance ◽

Extrinsic Base

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Double-polysilicon self-aligned SiGe HBT architecture based on nonselective epitaxy and polysilicon reflow

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352615 ◽

2012 ◽

Cited By ~ 2

Author(s):

H. Mertens ◽

P. H. C. Magnee ◽

J. J. T. M Donkers ◽

R. van Dalen ◽

I. Brunets ◽

...

Keyword(s):

Sige Hbt

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Modeling collector current noise PSD of SiGe HBTs including self-heating and non-quasi-static effects

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352623 ◽

2012 ◽

Author(s):

Khamesh Kumar ◽

Anjan Chakravorty

Keyword(s):

Current Noise ◽

Collector Current ◽

Self Heating

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Dynamic electrothermal analysis of bipolar devices and circuits relying on multi-port positive fraction Foster representation

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352621 ◽

2012 ◽

Cited By ~ 3

Author(s):

V. d'Alessandro ◽

M. de Magistris ◽

A. Magnani ◽

N. Rinaldi ◽

S. Russo

Keyword(s):

Positive Fraction ◽

Bipolar Devices

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Extraction of the emitter related space charge weighting factor parameters of HICUM L2.30 using the Lambert W function

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352638 ◽

2012 ◽

Cited By ~ 1

Author(s):

F. Stein ◽

Z. Huszka ◽

N. Derrier ◽

C. Maneux ◽

D. Celi

Keyword(s):

Space Charge ◽

Weighting Factor ◽

Lambert W Function ◽

Related Space

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2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352631 ◽

2012 ◽

Download Full-text

Welcome

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352630 ◽

2012 ◽

Download Full-text

Author index

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) ◽

10.1109/bctm.2012.6352633 ◽

2012 ◽

Download Full-text

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Call for papers

Best practices to ensure the stability of sige HBT cascode low noise amplifiers

Extrinsic base resistance optimization in DPSA-SEG SiGe:C HBTs

Double-polysilicon self-aligned SiGe HBT architecture based on nonselective epitaxy and polysilicon reflow

Modeling collector current noise PSD of SiGe HBTs including self-heating and non-quasi-static effects

Dynamic electrothermal analysis of bipolar devices and circuits relying on multi-port positive fraction Foster representation

Extraction of the emitter related space charge weighting factor parameters of HICUM L2.30 using the Lambert W function

Table of contents

Welcome

Author index

Export Citation Format

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Call for papers

Best practices to ensure the stability of sige HBT cascode low noise amplifiers

Extrinsic base resistance optimization in DPSA-SEG SiGe:C HBTs

Double-polysilicon self-aligned SiGe HBT architecture based on nonselective epitaxy and polysilicon reflow

Modeling collector current noise PSD of SiGe HBTs including self-heating and non-quasi-static effects

Dynamic electrothermal analysis of bipolar devices and circuits relying on multi-port positive fraction Foster representation

Extraction of the emitter related space charge weighting factor parameters of HICUM L2.30 using the Lambert W function

Table of contents

Welcome

Author index

2012 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM)
Latest Publications