2008 IEEE International High Level Design Validation and Test Workshop
Latest Publications

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Published By IEEE

9781424429226

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Panel: SoC power management implications on validation and testing

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695890 ◽

2008 ◽

Author(s):

Bhanu Kapoor ◽

John Goodenough ◽

Shankar Hemmady ◽

Shireesh Verma ◽

Manuel A. d'Abreu ◽

...

Keyword(s):

Power Management ◽

Management Implications

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Applications of decorator and observer design patterns in functional verification

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695867 ◽

2008 ◽

Cited By ~ 1

Author(s):

Farzin Karimi

Keyword(s):

Design Patterns ◽

Observer Design ◽

Functional Verification

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Timing verification of distributed network systems at higher levels of abstraction

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695884 ◽

2008 ◽

Author(s):

Hassan Hatefi-Ardakani ◽

Amir Masoud Gharehbaghi ◽

Shaahin Hessabi

Keyword(s):

Distributed Network ◽

Timing Verification ◽

Levels Of Abstraction ◽

Network Systems

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A HW/SW co-simulation framework for the verification of multi-CPU systems

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695888 ◽

2008 ◽

Cited By ~ 3

Author(s):

S. Cordibella ◽

F. Fummi ◽

G. Perbellini ◽

D. Quaglia

Keyword(s):

Simulation Framework

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Temporal parallel gate-level timing simulation

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695886 ◽

2008 ◽

Cited By ~ 2

Author(s):

Dusung Kim ◽

Maciej Ciesielski ◽

Kyuho Shim ◽

Seiyang Yang

Keyword(s):

Timing Simulation

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On Chip Instrument application to SoC analysis

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695879 ◽

2008 ◽

Author(s):

Neal Stollon

Keyword(s):

On Chip

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On dynamic switching of navigation for semi-formal design validation

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695873 ◽

2008 ◽

Cited By ~ 1

Author(s):

Ankur Parikh ◽

Michael S. Hsiao

Keyword(s):

Design Validation ◽

Dynamic Switching ◽

Formal Design

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Session 2: Test

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695868 ◽

2008 ◽

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Injecting intermittent faults for the dependability validation of commercial microcontrollers

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695899 ◽

2008 ◽

Cited By ~ 9

Author(s):

D. Gil ◽

L.J. Saiz ◽

J. Gracia ◽

J.C. Baraza ◽

P.J. Gil

Keyword(s):

Intermittent Faults

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Test and validation of a non-deterministic system — True Random Number Generator

2008 IEEE International High Level Design Validation and Test Workshop ◽

10.1109/hldvt.2008.4695881 ◽

2008 ◽

Cited By ~ 2

Author(s):

Kapila Udawatta ◽

Mehdi Ehsanian ◽

Sergey Maidanov ◽

Surya Musunuri

Keyword(s):

Random Number ◽

Random Number Generator ◽

Deterministic System ◽

Number Generator ◽

True Random Number Generator

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2008 IEEE International High Level Design Validation and Test WorkshopLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Panel: SoC power management implications on validation and testing

Applications of decorator and observer design patterns in functional verification

Timing verification of distributed network systems at higher levels of abstraction

A HW/SW co-simulation framework for the verification of multi-CPU systems

Temporal parallel gate-level timing simulation

On Chip Instrument application to SoC analysis

On dynamic switching of navigation for semi-formal design validation

Session 2: Test

Injecting intermittent faults for the dependability validation of commercial microcontrollers

Test and validation of a non-deterministic system — True Random Number Generator

2008 IEEE International High Level Design Validation and Test Workshop
Latest Publications