Perspectives, Science and Technologies for Novel Silicon on Insulator Devices
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Published By Springer Netherlands

9780792361176, 9789401142618
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Characterization of Porous Silicon Layers Containing A Buried Oxide Layer

2000 ◽  
pp. 195-204 ◽  
Author(s):  
S. I. Romanov ◽  
A. V. Dvurechenskii ◽  
Yu. I. Yakovlev ◽  
R. Grötzschel ◽  
U. Kreissig ◽  
...  
Keyword(s):  
Porous Silicon ◽  
Oxide Layer ◽  
Buried Oxide

Optical Spectroscopy of SOI Materials

2000 ◽  
pp. 137-148
Author(s):  
Alejandro Pérez-Rodríguez ◽  
Christophe Serre ◽  
Joan Ramón Morante
Keyword(s):  
Optical Spectroscopy

Total-Dose Radiation Response of Multilayer Buried Insulators

2000 ◽  
pp. 205-212
Author(s):  
A. N. Rudenko ◽  
V. S. Lysenko ◽  
A. N. Nazarov ◽  
I. P. Barchuk ◽  
V. I. Kilchytska ◽  
...  
Keyword(s):  
Total Dose ◽  
Radiation Response ◽  
Dose Radiation

β-SiC on SiO2 Formed by ION Implantation and Bonding for Micromechanics Applications

2000 ◽  
pp. 121-126
Author(s):  
C. Serre ◽  
A. Pérez-Rodríguez ◽  
A. Romano-Rodríguez ◽  
J. R. Morante ◽  
L. Fonseca ◽  
...  
Keyword(s):  
Ion Implantation
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