In-Situ Electron Microscopy
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Published By Wiley-VCH Verlag Gmbh & Co. Kgaa

9783527652167, 9783527319732

2012 ◽  
pp. 71-97 ◽  
Author(s):  
Thomas Lagrange ◽  
Bryan W. Reed ◽  
Wayne E. King ◽  
Judy S. Kim ◽  
Geoffrey H. Campbell

2012 ◽  
pp. 347-369 ◽  
Author(s):  
Josef Zweck
Keyword(s):  

2012 ◽  
pp. 191-208
Author(s):  
Guangwen Zhou ◽  
Judith C. Yang
Keyword(s):  

2012 ◽  
pp. 123-143
Author(s):  
Florian Banhart
Keyword(s):  

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