System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced Microelectronics
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Published By Springer London

9781852338992, 9781846281457

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Test Generation: A Hierarchical Approach

System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced Microelectronics ◽

10.1007/1-84628-145-8_5 ◽

2005 ◽

pp. 67-81

Author(s):

G. Jervan ◽

R. Ubar ◽

Z. Peng ◽

P. Eles

Keyword(s):

Test Generation ◽

Hierarchical Approach

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Test Generation: A Heuristic Approach

System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced Microelectronics ◽

10.1007/1-84628-145-8_4 ◽

2005 ◽

pp. 47-65

Author(s):

O. Goloubeva ◽

M. Sonza Reorda ◽

M. Violante

Keyword(s):

Test Generation ◽

Heuristic Approach

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System-level Dependability Analysis

System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced Microelectronics ◽

10.1007/1-84628-145-8_9 ◽

2005 ◽

pp. 151-174

Author(s):

A. Bobbio ◽

D. Codetta Raiteri ◽

M. De Pierro ◽

G. Franceschinis

Keyword(s):

System Level ◽

Dependability Analysis

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Test Generation: A Symbolic Approach

System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced Microelectronics ◽

10.1007/1-84628-145-8_3 ◽

2005 ◽

pp. 27-46

Author(s):

F. Fummi ◽

G. Pravadelli

Keyword(s):

Test Generation ◽

Symbolic Approach

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An Approach to System-level Design for Test

System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced Microelectronics ◽

10.1007/1-84628-145-8_8 ◽

2005 ◽

pp. 121-149

Author(s):

G. Jervan ◽

R. Ubar ◽

Z. Peng ◽

P. Eles

Keyword(s):

System Level ◽

Design For Test ◽

System Level Design ◽

Level Design

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System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced MicroelectronicsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer London

Test Generation: A Hierarchical Approach

Test Generation: A Heuristic Approach

System-level Dependability Analysis

Test Generation: A Symbolic Approach

An Approach to System-level Design for Test

System-level Test and Validation of Hardware/Software Systems - Springer Series in Advanced Microelectronics
Latest Publications