Optical Techniques for Solid-State Materials Characterization
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Published By CRC Press

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Ultrafast Pump–Probe Spectroscopy

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-15 ◽

2016 ◽

pp. 352-393 ◽

Cited By ~ 2

Keyword(s):

Pump Probe ◽

Probe Spectroscopy

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The Optical Properties of Metals: From Wideband to Narrowband Materials

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-9 ◽

2016 ◽

pp. 102-133

Keyword(s):

Optical Properties

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Time-Domain and Ultrafast Terahertz Spectroscopy

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-17 ◽

2016 ◽

pp. 420-465 ◽

Cited By ~ 2

Keyword(s):

Time Domain ◽

Terahertz Spectroscopy

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Carrier Dynamics in Bulk Semiconductors and Metals after Ultrashort Pulse Excitation

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-14 ◽

2016 ◽

pp. 314-351

Keyword(s):

Ultrashort Pulse ◽

Carrier Dynamics ◽

Pulse Excitation ◽

Bulk Semiconductors

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Raman Scattering as a Tool for Studying Complex Materials

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-12 ◽

2016 ◽

pp. 216-259

Keyword(s):

Raman Scattering ◽

Complex Materials

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Light–Matter Interactions

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-7 ◽

2016 ◽

pp. 26-61

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Time-Resolved Magneto-Optical Spectroscopy

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-19 ◽

2016 ◽

pp. 490-529

Keyword(s):

Optical Spectroscopy ◽

Time Resolved

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Time-Resolved Photoluminescence Spectroscopy

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-18 ◽

2016 ◽

pp. 466-489 ◽

Cited By ~ 1

Keyword(s):

Photoluminescence Spectroscopy ◽

Time Resolved ◽

Time Resolved Photoluminescence

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Semiconductors and Their Nanostructures

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-8 ◽

2016 ◽

pp. 62-101

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Near-Field Scanning Optical Microscopy

Optical Techniques for Solid-State Materials Characterization ◽

10.1201/b11040-23 ◽

2016 ◽

pp. 642-685

Keyword(s):

Optical Microscopy ◽

Near Field ◽

Scanning Optical Microscopy ◽

Near Field Scanning

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Optical Techniques for Solid-State Materials CharacterizationLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By CRC Press

Ultrafast Pump–Probe Spectroscopy

The Optical Properties of Metals: From Wideband to Narrowband Materials

Time-Domain and Ultrafast Terahertz Spectroscopy

Carrier Dynamics in Bulk Semiconductors and Metals after Ultrashort Pulse Excitation

Raman Scattering as a Tool for Studying Complex Materials

Light–Matter Interactions

Time-Resolved Magneto-Optical Spectroscopy

Time-Resolved Photoluminescence Spectroscopy

Semiconductors and Their Nanostructures

Near-Field Scanning Optical Microscopy

Optical Techniques for Solid-State Materials Characterization
Latest Publications