2006 68th ARFTG Conference: Microwave Measurement
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9781424406760

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Traceability to national standards for S-parameter measurements of devices fitted with precision 1.85 mm coaxial connectors

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361648 ◽

2006 ◽

Author(s):

Nick M. Ridler

Keyword(s):

National Standards ◽

S Parameter

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Microwave system for drying of textile: Design, model and evaluation

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361662 ◽

2006 ◽

Author(s):

Marika Pourova ◽

Jan Vrba ◽

Ondrej Zak

Keyword(s):

Design Model ◽

Textile Design ◽

Microwave System

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Design of scanning capacitance microscope

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361654 ◽

2006 ◽

Cited By ~ 1

Author(s):

Hassan Tanbakuchi ◽

Matt Richter ◽

Mike Whitener

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Scanning near-field microwave microscopy for spatially localized metrology of nano-scale materials and devices

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361653 ◽

2006 ◽

Author(s):

Vladimir V. Talanov ◽

Andrew R. Schwartz

Keyword(s):

Near Field ◽

Nano Scale ◽

Microwave Microscopy

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Real-time active load-pull of the 2nd & 3rd harmonics for interactive design of non-linear power amplifiers

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361651 ◽

2006 ◽

Cited By ~ 1

Author(s):

Xian Cui ◽

Seok Joo Doo ◽

Patrick Roblin ◽

Gregg H. Jessen ◽

Roberto G. Rojas ◽

...

Keyword(s):

Real Time ◽

Power Amplifiers ◽

Interactive Design ◽

Active Load ◽

Non Linear ◽

Load Pull

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68th ARFTG conference organizers

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361645 ◽

2006 ◽

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True pulse load-pull measurement setup for high power transistors characterization

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361671 ◽

2006 ◽

Author(s):

J M Coupat ◽

L. Tebaldini ◽

J. Sirois ◽

B. Noori ◽

R. Wallace

Keyword(s):

High Power ◽

Pulse Load ◽

Power Transistors ◽

Load Pull

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RF vector measurement test-bench for evaluation of behavioral model accuracy under realistic excitation

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361649 ◽

2006 ◽

Author(s):

Maciej Myslinski ◽

Kate A. Remley ◽

Dominique Schreurs ◽

Bart Nauwelaers

Keyword(s):

Test Bench ◽

Behavioral Model ◽

Model Accuracy ◽

Vector Measurement

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Verification of wafer-level calibration accuracy at cryogenic temperatures

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361666 ◽

2006 ◽

Cited By ~ 1

Author(s):

Andrej Rumiantsev ◽

Ralf Doerner ◽

Paulius Sakalas

Keyword(s):

Cryogenic Temperatures ◽

Wafer Level ◽

Calibration Accuracy

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Coaxial probe dielectric measurements: Practical dotting “i's” and crossing “t's”

2006 68th ARFTG Conference: Microwave Measurement ◽

10.1109/arftg.2006.8361673 ◽

2006 ◽

Author(s):

H C Reader ◽

M D Janezic

Keyword(s):

Dielectric Measurements ◽

Coaxial Probe

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2006 68th ARFTG Conference: Microwave MeasurementLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Traceability to national standards for S-parameter measurements of devices fitted with precision 1.85 mm coaxial connectors

Microwave system for drying of textile: Design, model and evaluation

Design of scanning capacitance microscope

Scanning near-field microwave microscopy for spatially localized metrology of nano-scale materials and devices

Real-time active load-pull of the 2nd & 3rd harmonics for interactive design of non-linear power amplifiers

68th ARFTG conference organizers

True pulse load-pull measurement setup for high power transistors characterization

RF vector measurement test-bench for evaluation of behavioral model accuracy under realistic excitation

Verification of wafer-level calibration accuracy at cryogenic temperatures

Coaxial probe dielectric measurements: Practical dotting “i's” and crossing “t's”

2006 68th ARFTG Conference: Microwave Measurement
Latest Publications