Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals
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Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62778-7 ◽

1990 ◽

pp. iii

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Glossary of Symbols

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62790-8 ◽

1990 ◽

pp. 421-422

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Chapter 3 Picosecond Photoconductivity: High-Speed Measurements of Devices and Materials

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62785-4 ◽

1990 ◽

pp. 85-134 ◽

Cited By ~ 15

Author(s):

D.H. Auston

Keyword(s):

High Speed

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Chapter 2 Electronic Wafer Probing Techniques

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62784-2 ◽

1990 ◽

pp. 41-83 ◽

Cited By ~ 6

Author(s):

Hermann Schumacher ◽

Eric W. Strid

Keyword(s):

Wafer Probing

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Chapter 5 Direct Optical Probing of Integrated Circuits and High-Speed Devices

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62787-8 ◽

1990 ◽

pp. 221-334 ◽

Cited By ~ 9

Author(s):

J.M. Wiesenfeld ◽

R.K. Jain

Keyword(s):

Integrated Circuits ◽

High Speed ◽

Optical Probing

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Chapter 6 Electron-Beam Probing

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62788-x ◽

1990 ◽

pp. 335-382 ◽

Cited By ~ 6

Author(s):

Graham Plows

Keyword(s):

Electron Beam

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Copyright page

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62779-9 ◽

1990 ◽

pp. iv

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Index

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62791-x ◽

1990 ◽

pp. 423-429

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List of Contributors

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62781-7 ◽

1990 ◽

pp. xi

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Chapter 7 Photoemissive Probing

Measurement of High-Speed Signals in Solid State Devices - Semiconductors and Semimetals ◽

10.1016/s0080-8784(08)62789-1 ◽

1990 ◽

pp. 383-420 ◽

Cited By ~ 2

Author(s):

A.M. Weiner ◽

R.B. Marcus

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