Electronics Reliability and Measurement Technology
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Electronics Reliability and Measurement Technology ◽

10.1016/b978-0-8155-1171-7.50018-4 ◽

1988 ◽

pp. iii

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HANDBOOK OF CONTAMINATION CONTROL IN MICROELECTRONICS: Principles, Applications and Technology

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50016-0 ◽

1988 ◽

pp. ibc1 ◽

Cited By ~ 1

Author(s):

Donald L. Tolliver

Keyword(s):

Contamination Control

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“WHOLE WAFER” SCANNING ELECTRON MICROSCOPY

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50015-9 ◽

1988 ◽

pp. 123-128

Author(s):

J. Devaney

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Scanning Electron

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HETERODYNE HOLOGRAPHIC INTERFEROMETRY: HIGH-RESOLUTION RANGING AND DISPLACEMENT MEASUREMENT

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50014-7 ◽

1988 ◽

pp. 107-122

Author(s):

James W. Wagner

Keyword(s):

High Resolution ◽

Holographic Interferometry ◽

Displacement Measurement

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INTELLIGENT LASER SOLDERING INSPECTION AND PROCESS CONTROL

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50012-3 ◽

1988 ◽

pp. 79-88 ◽

Cited By ~ 1

Author(s):

Riccardo Vanzetti

Keyword(s):

Process Control ◽

Laser Soldering

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SURFACE INSPECTION–RESEARCH AND DEVELOPMENT

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50006-8 ◽

1988 ◽

pp. 34-36

Author(s):

J.S. Batchelder

Keyword(s):

Research And Development ◽

Surface Inspection

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EXECUTIVE SUMMARY OF FINDINGS AND RECOMMENDATIONS

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50003-2 ◽

1988 ◽

pp. 1-6

Keyword(s):

Executive Summary

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RADIATION EFFECTS ON AND DOSE ENHANCEMENT OF ELECTRONIC MATERIALS

Electronics Reliability and Measurement Technology ◽

10.1016/b978-0-8155-1171-7.50020-2 ◽

1988 ◽

pp. ibc3

Author(s):

J.R. Srour ◽

D.M. Long

Keyword(s):

Radiation Effects ◽

Electronic Materials ◽

Dose Enhancement

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RUPTURE TESTING FOR THE QUALITY CONTROL OF ELECTRODEPOSITED COPPER INTERCONNECTIONS IN HIGH-SPEED, HIGH-DENSITY CIRCUITS

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50013-5 ◽

1988 ◽

pp. 89-106

Author(s):

Louis Zakraysek

Keyword(s):

Quality Control ◽

High Speed ◽

High Density

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MEASUREMENT SCIENCE AND MANUFACTURING SCIENCE RESEARCH

Electronics Reliability and Measurement Technology ◽

10.1016/b978-081551171-7.50004-4 ◽

1988 ◽

pp. 7-16

Author(s):

D. Howard Phillips

Keyword(s):

Science Research ◽

Measurement Science ◽

Manufacturing Science

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Electronics Reliability and Measurement TechnologyLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Elsevier

Copyright

HANDBOOK OF CONTAMINATION CONTROL IN MICROELECTRONICS: Principles, Applications and Technology

“WHOLE WAFER” SCANNING ELECTRON MICROSCOPY

HETERODYNE HOLOGRAPHIC INTERFEROMETRY: HIGH-RESOLUTION RANGING AND DISPLACEMENT MEASUREMENT

INTELLIGENT LASER SOLDERING INSPECTION AND PROCESS CONTROL

SURFACE INSPECTION–RESEARCH AND DEVELOPMENT

EXECUTIVE SUMMARY OF FINDINGS AND RECOMMENDATIONS

RADIATION EFFECTS ON AND DOSE ENHANCEMENT OF ELECTRONIC MATERIALS

RUPTURE TESTING FOR THE QUALITY CONTROL OF ELECTRODEPOSITED COPPER INTERCONNECTIONS IN HIGH-SPEED, HIGH-DENSITY CIRCUITS

MEASUREMENT SCIENCE AND MANUFACTURING SCIENCE RESEARCH

Electronics Reliability and Measurement Technology
Latest Publications