2015 IEEE 33rd VLSI Test Symposium (VTS)
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9781479975976
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scholarly journals Special session: Hot topics: Statistical test methods

2015 ◽  
Author(s):  
Manuel J. Barragan ◽  
Gildas Leger ◽  
Florence Azais ◽  
R. D. Blanton ◽  
Adit D. Singh ◽  
...  
Keyword(s):  
Test Methods ◽  
Statistical Test ◽  
Special Session

ExTest scheduling for 2.5D system-on-chip integrated circuits

2015 ◽  
Author(s):  
Ran Wang ◽  
Guoliang Li ◽  
Rui Li ◽  
Jun Qian ◽  
Krishnendu Chakrabarty
Keyword(s):  
Integrated Circuits ◽  
System On Chip ◽  
On Chip

Yield prognosis for fab-to-fab product migration

2015 ◽  
Author(s):  
Ali Ahmadi ◽  
Ke Huang ◽  
Amit Nahar ◽  
Bob Orr ◽  
Michael Pas ◽  
...  

Resiliency challenges in sub-10nm technologies

2015 ◽  
Author(s):  
Rob Aitken ◽  
Ethan H. Cannon ◽  
Mondira Pant ◽  
Mehdi B. Tahoori

3D microelectronic with BEOL compatible devices

2015 ◽  
Author(s):  
D Drouin ◽  
M A-Bounouar ◽  
G Droulers ◽  
M Labalette ◽  
M Pioro-Ladriere ◽  
...  
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