Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science
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Published By Springer Berlin Heidelberg

9783642074585, 9783662052273

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Surface Analysis of Polymers

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_23 ◽

2003 ◽

pp. 519-551 ◽

Cited By ~ 2

Author(s):

H. A. W. StJohn ◽

T. R. Gengenbach ◽

P. G. Hartley ◽

H J. Griesser

Keyword(s):

Surface Analysis

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Application to Semiconductor Devices

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_18 ◽

2003 ◽

pp. 435-454 ◽

Cited By ~ 1

Author(s):

P. W. Leech ◽

P. Ressel

Keyword(s):

Semiconductor Devices

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Low Energy Electron Diffraction

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_13 ◽

2003 ◽

pp. 319-335

Author(s):

P. J. Jennings ◽

C. Q. Sun

Keyword(s):

Electron Diffraction ◽

Low Energy ◽

Energy Electron ◽

Low Energy Electron Diffraction ◽

Low Energy Electron

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Solid Surfaces, Their Structure and Composition

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_1 ◽

2003 ◽

pp. 3-69

Author(s):

C. Klauber ◽

R. St. C. Smart

Keyword(s):

Solid Surfaces

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Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_9 ◽

2003 ◽

pp. 229-246 ◽

Cited By ~ 1

Author(s):

S. H. Sie

Keyword(s):

Nuclear Reaction ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Nuclear Reaction Analysis

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Thin Film Analysis

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_21 ◽

2003 ◽

pp. 489-503

Author(s):

G. C. Morris

Keyword(s):

Thin Film ◽

Film Analysis ◽

Thin Film Analysis

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Characterization of Catalysts by Surface Analysis

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_17 ◽

2003 ◽

pp. 405-433 ◽

Cited By ~ 2

Author(s):

N. K. Singh ◽

B. G. Baker

Keyword(s):

Surface Analysis

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Ultraviolet Photoelectron Spectroscopy of Solids

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_14 ◽

2003 ◽

pp. 337-345 ◽

Cited By ~ 1

Author(s):

R. Leckey

Keyword(s):

Photoelectron Spectroscopy ◽

Ultraviolet Photoelectron Spectroscopy

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UHV Basics

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_2 ◽

2003 ◽

pp. 71-81

Author(s):

C. Klauber

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Glow Discharge Optical Emission Spectrometry

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science ◽

10.1007/978-3-662-05227-3_24 ◽

2003 ◽

pp. 553-559 ◽

Cited By ~ 4

Author(s):

T. Nelis ◽

R. Payling

Keyword(s):

Glow Discharge ◽

Optical Emission ◽

Optical Emission Spectrometry ◽

Emission Spectrometry

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Springer Series in Surface Sciences - Surface Analysis Methods in Materials ScienceLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer Berlin Heidelberg

Surface Analysis of Polymers

Application to Semiconductor Devices

Low Energy Electron Diffraction

Solid Surfaces, Their Structure and Composition

Rutherford Backscattering Spectrometry and Nuclear Reaction Analysis

Thin Film Analysis

Characterization of Catalysts by Surface Analysis

Ultraviolet Photoelectron Spectroscopy of Solids

UHV Basics

Glow Discharge Optical Emission Spectrometry

Springer Series in Surface Sciences - Surface Analysis Methods in Materials Science
Latest Publications