diffraction peak width
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2016 ◽  
Vol 49 (1) ◽  
pp. 103-109 ◽  
Author(s):  
S. Frølich ◽  
H. Leemreize ◽  
A. Jakus ◽  
X. Xiao ◽  
R. Shah ◽  
...  

A model sample consisting of two different hydroxyapatite (hAp) powders was used as a bone phantom to investigate the extent to which X-ray diffraction tomography could map differences in hAp lattice constants and crystallite size. The diffraction data were collected at beamline 1-ID, the Advanced Photon Source, using monochromatic 65 keV X-radiation, a 25 × 25 µm pinhole beam and translation/rotation data collection. The diffraction pattern was reconstructed for each volume element (voxel) in the sample, and Rietveld refinement was used to determine the hAp lattice constants. The crystallite size for each voxel was also determined from the 00.2 hAp diffraction peak width. The results clearly show that differences between hAp powders could be measured with diffraction tomography.


2016 ◽  
Vol 99 (3) ◽  
pp. 765-768 ◽  
Author(s):  
Jean‐Marie Lebrun ◽  
Shikhar K. Jha ◽  
Kiran S. Naik ◽  
Kevin C. Seymour ◽  
Waltraud M. Kriven ◽  
...  

2013 ◽  
Vol 772 ◽  
pp. 79-83
Author(s):  
Krzysztof Wierzbanowski ◽  
Andrzej Baczmanski ◽  
Roman Wawszczak ◽  
Marcin Wronski ◽  
Mirosław Wróbel ◽  
...  

The relation between residual stresses occurring in plastically deformed material and after subsequent annealing is of practical and theoretical importance. In the present work the X-ray multi-reflection method was applied to determine residual stresses and their orientation distribution in rolled and annealed ferrite and austenite steel samples. An important decrease of the first- and the second-order residual stresses was observed during recovery and recrystallization processes. Diffraction peak width was also studied and correlated with stress variation during annealing. Different kinetics of stress relaxation in ferrite and austenite were explained by different levels of stacking fault energy and different types of intergranular interactions occurring in these materials.


2011 ◽  
Vol 681 ◽  
pp. 332-339 ◽  
Author(s):  
Wei Li ◽  
Philip J. Withers ◽  
Michael Preuss ◽  
Judith Shackleton ◽  
Paul Andrews

This paper investigates the variation of residual stress with depth and radial location in a nickel base superalloy, RR1000, introduced by face finish turning. X-ray diffraction stress measurement has revealed that the hoop stress at the surface becomes less tensile towards the centre of the face, whilst the level of radial sub-surface compression increases. The unstrained lattice spacing d0 and the diffraction peak width (FWHM) were used to make inferences regarding the thermal excursion and the plastic work, respectively. It was found the increase in the compressive stress from the outer towards the inner radius was associated with an increase in thermal excursion.


2010 ◽  
Vol 652 ◽  
pp. 279-284 ◽  
Author(s):  
Roman Wawszczak ◽  
Andrzej Baczmanski ◽  
Chedly Braham ◽  
Wilfrid Seiler ◽  
Mirosław Wróbel ◽  
...  

Diffraction method was applied to determine the residual stresses in deformed and annealed polycrystalline samples of ferritic steel. The specific stored elastic energy corresponding to the grain stresses was calculated and presented in Euler space. An important decrease of the first and second order residual stresses and consequently stored elastic energy was observed during recovery and recrystallization. The evolution of stresses was correlated with the variation of diffraction peak width (related to dislocations density) and crystallographical texture.


2003 ◽  
Vol 795 ◽  
Author(s):  
Nail R. Chamsoutdinov ◽  
Amarante J. Böttger ◽  
Rob Delhez ◽  
Frans D. Tichelaar

ABSTRACTThe thermo-mechanical behavior of magnetron sputtered Fe polycrystalline films of thickness between 50 nm and 400 nm has been investigated. The state of stress has been determined by means of wafer curvature and X-ray diffraction (sin2ψ-method). Both methods are in good agreement for layers of thickness above 200 nm. For specimens of smaller layer thickness, however, the average stresses as measured by X-ray diffraction are systematically higher than those observed by wafer curvature experiments. The results can be interpreted in terms of differences in micro-strain (estimated using X-ray diffraction peak width analysis) and grain size as obtained by transmission and scanning electron microscopy. Thermal cycling experiments were performed between RT and 873 K. The effect of microstructure on thermo-mechanical properties was shown to be crucial.


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