Carrier photodynamics in 2D perovskites with solution-processed silver and graphene contacts for bendable optoelectronics

Silver (Ag) and graphene (Gr) inks have been engineered to serve as efficient electrical contacts for solution-processed two-dimensional (2D) organo-halide (CH3(CH2)3NH3)2(CH3NH3)n−1PbnI3n+1 (n = 4) layered perovskites, where all inkjet-printed heterostructure photodetectors (PDs) were fabricated on polyimide (PI) substrates. To date, limited studies exist that compare multiple contacts to enable high-performance engineered contacts to 2D perovskites. Moreover, of these few reports, such studies have examined contacts deposited using vapor-based techniques that are time-consuming and require expensive, specialized deposition equipment. In this work, we report on the inkjet printed, direct contact study of solution-processed, 2D perovskite-based PDs formed on flexible PI substrates. Solution processing offers a cost-effective, expedient route for inkjet printing Gr and Ag using a dispersion chemistry developed in this work that is compatible with the underlying 2D perovskite layer to construct the PDs. The wavelength λ-dependent photocurrent Ip peaked at λ ~ 630 nm for both PDs, consistent with the bandgap Eg ~ 1.96 eV for our semiconducting 2D perovskite absorber layer. The external quantum efficiency was determined to be 103% for Ag-perovskite PDs, where strain-dependent bending tests were also conducted to reveal the opto-mechanical modulation of the photocurrent in our devices.

Progress in the mechanical modulation of cell functions in tissue engineering

This work provides a comprehensive view on how multiple mechanical cues of the substrate influence fundamental cellular processes, including spreading, proliferation, migration and differentiation, towards 3D tissue constructs.

An Apparatus for Spectral Emissivity Measurements of Thermal Control Materials at Low Temperatures

Thermal control materials are employed to adjust the temperature of a spacecraft operating in deep space. The spectral emissivity is a crucial factor in evaluating the thermal radiative properties of such materials. An apparatus, composed of a Fourier transform infrared spectrometer (FTIR), a sample cooling chamber and a mechanical modulation system was demonstrated to measure low temperature infrared spectral emissivity under vacuum. The mechanical modulation system, which includes a chopper and a lock-in amplifier, is employed to reduce the interference of background radiation during measurements. The limitation of the Fourier transform frequency on the chopper frequency can be eliminated by setting the FTIR on step-scan mode. The apparatus is separated into two parts and evacuated by different pumps. In this study, a high quality emission spectrum of a sample is measured by the apparatus. The spectral emissivity of thermal control materials are obtained in the wavelength range of 8 to 14 μm at 173 and 213 K. The combined standard uncertainty of the apparatus is 3.30% at 213 K.