Radar Imaging Statistics of Non-Gaussian Rough Surface: A Physics-Based Simulation Study

This paper investigates the radar image statistics of rough surfaces by simulating the scattered signal’s dependence on the surface roughness. Statistically, the roughness characteristics include the height probability density (HPD) and, to the second-order, the power spectral density (PSD). We simulated the radar backscattered signal by computing the far-field scattered field from the rough surface within the antenna beam volume in the context of synthetic aperture radar (SAR) imaging. To account for the non-Gaussian height distribution, we consider microscopic details of the roughness on comparable radar wavelength scales to include specularly, singly, and multiply scatterers. We introduce surface roughness index (RSI) to distinguish the statistical characteristics of rough surfaces with different height distributions. Results suggest that increasing the RMS height does not impact the Gaussian HPD surface but significantly affects the Weibull surface. The results confirm that as the radar frequency increases, or reaches a relatively larger roughness, the surface’s HPD causes significant changes in incoherent scattering due to more frequent multiple scattering contributions. As a result, the speckle move further away from the Rayleigh model. By examining individual RSI, we see that the Gaussian HPD surface is much less sensitive to RMS height than the Weibull HPD surface. We demonstrate that to retrieve the surface parameters (both dielectric and roughness) from the estimated RCS, less accuracy is expected for the non-Gaussian surface than the Gaussian surface under the same conditions. Therefore, results drawn from this study are helpful for system performance evaluations, parameters estimation, and target detection for SAR imaging of a rough surface.

MEMS Accelerometer Noises Analysis Based on Triple Estimation Fractional Order Algorithm

This paper is devoted to identifying parameters of fractional order noises with application to noises obtained from MEMS accelerometer. The analysis and parameters estimation will be based on the Triple Estimation algorithm, which can simultaneously estimate state, fractional order, and parameter estimates. The capability of the Triple Estimation algorithm to fractional noises estimation will be confirmed by the sets of numerical analyses for fractional constant and variable order systems with Gaussian noise input signal. For experimental data analysis, the MEMS sensor SparkFun MPU9250 Inertial Measurement Unit (IMU) was used with data obtained from the accelerometer in x, y and z-axes. The experimental results clearly show the existence of fractional noise in this MEMS’ noise, which can be essential information in the design of filtering algorithms, for example, in inertial navigation.

A Simplified Tantalum Oxide Memristor Model, Parameters Estimation and Application in Memory Crossbars

In this paper, an improved and simplified modification of a tantalum oxide memristor model is presented. The proposed model is applied and analyzed in hybrid and passive memory crossbars in LTSPICE environment and is based on the standard Ta2O5 memristor model proposed by Hewlett–Packard. The discussed modified model has several main enhancements—inclusion of a simplified window function, improvement of its effectiveness by the use of a simple expression for the i–v relationship, and replacement of the classical Heaviside step function with a differentiable and flat step-like function. The optimal values of coefficients of the tantalum oxide memristor model are derived by comparison of experimental current–voltage relationships and by using a procedure for parameter estimation. A simplified LTSPICE library model, correspondent to the analyzed tantalum oxide memristor, is created in accordance with the considered mathematical model. The improved and altered Ta2O5 memristor model is tested and simulated in hybrid and passive memory crossbars for a state near to a hard-switching operation. After a comparison of several of the best existing memristor models, the main pros of the proposed memristor model are highlighted—its improved implementation, better operating rate, and good switching properties.

ELECTRICAL PARAMETERS ESTIMATION OF SINGLE DIODE PV MODULE MODEL USING HYBRID METAHEURISTIC ALGORIHM

In this paper, an improved hybrid algorithm called differential evolution with integrated mutation per iteration (DEIM) is proposed to extract five parameters of single-diode PV module model obtained by combining differential evolution (DE) algorithm and electromagnetic-like (EML) algorithm. The EML algorithm's attraction-repulsion idea is employed in DEIM in order to enhance the mutation process of DE. The proposed algorithm is validated with other methods using experimental I-V data. The results of presented method reveal that simulated I-V characteristics have a high degree of agreement with experimental ones. The proposed model has an average root mean square error of 0.062A, an absolute error of 0.0452A, a mean bias error of 0.006A, a coefficient of determination of 0.992, a standard test deviation around 0.04540, and 15.33sec as execution time. The results demonstrate that the proposed method is better in terms of the accuracy and execution time (convergence) when compared with other methods where provide less errors.