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scholarly journals Standard Free Thickness Determination of Thin TEM Samples via Backscatter Electron Image Correlation

2009 ◽  
Vol 15 (S2) ◽  
pp. 340-341 ◽  
Author(s):  
R Salzer ◽  
A Graff ◽  
M Simon ◽  
F Altmann
Keyword(s):  
Image Correlation ◽  
Backscatter Electron Image ◽  
Backscatter Electron ◽  
Thickness Determination ◽  
Electron Image

Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

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