total internal reflection condition
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2014 ◽  
Vol 22 (21) ◽  
pp. 25362 ◽  
Author(s):  
Takayuki Matsui ◽  
Atsushi Miura ◽  
Naoki Ikeda ◽  
Hisayoshi Fujikawa ◽  
Yoshimasa Sugimoto ◽  
...  

2011 ◽  
Vol 18 (06) ◽  
pp. 261-265 ◽  
Author(s):  
R. CORTES ◽  
V. COELLO ◽  
P. SEGOVIA ◽  
C. GARCÍA ◽  
J. M. MERLO ◽  
...  

We investigate experimentally the interference in far-field radiation of two contra-propagating evanescent fields using a conventional optical microscope. A laser beam illuminates a glass-air interface under total internal reflection condition and through the proper setup a double evanescent illumination was produced. The evanescent fields radiate from the surface into the far-field domain due to small surface scatterers. Thus, coherent interference is produced in the far-field region which is correlated with the relative positions of the evanescent illumination sources. Finally, the above-described could be considered as a device for high accuracy micro-scale measurements as well as a direct visualization method of evanescent phenomena.


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