Анизотропия отрицательного магнетосопротивления в эапитаксиальных слоях GaMnAs

Anisotropy of magnetotransport properties of GaMnAs epitaxial layers in ferromagnetic state has been investigated as a function of temperature. The anisotropy of negative magnetoresistance that is not related to uniaxial anisotropy and hard axis orientation has been observed. This anisotropy may be result of arising of spatially oriented structures in the GaMnAs layer during its growth.

Planar Hall Effect of GaMnAs

Anisotropy magneto-resistance and planar Hall-effect of ferromagnetic GaMnAs epitaxial films were investigated. The films were grown on 2 o off-cut GaAs (001) substrate in an optimized growth condition via low temperature molecular beam epitaxy. The GaMnAs layer revealed an easy axis along the (2x4) reconstruction direction of the substrate or along the off-cut direction. The large value of the anisotropy magneto-resistance ratio of ~7 % was realized by a well-alignment of the easy axis of the homogeneous ferromagnetic GaMnAs layer with the current. It also gives a very high planar Hall resistance ratio of ~500 %.

Effects of defects on the electrical and magnetic properties of Ga1−x MnxAs layer

ABSTRACTWe investigated the effects of V/III flux ratios on the Curie temperature, TC, in Ga1−x Mnx As layers with various Mn mole fractions of x = 0.03 and 0.05. A 75 nm thick GaMnAs layer was grown at the temperature of 250 °C with various V/III flux ratios of 25∼34. The low temperature molecular beam epitaxy (LT-MBE) method for growth of GaMnAs layer caused the defects related by excess As and Mn interstitial, and these leaded the formation of deep level. We investigated that formation of deep level was established with various Mn mole fraction for V/III flux ratio 34. The changes of TC are observed by varying V/III flux ratio with a fixed Mn mole fraction. The TC in the sample grown with a lower V/III flux ratio of 25 is found to be higher comparing to that with higher V/III flux ratio of 34 at a fixed high Mn concentration (x = 0.05). Although the Mn concentration increases, the TC is not much changed when the V/III flux ratio is high of 34. The changes of TC with various V/III flux ratios are explained by the existence of low temperature grown defects, which are clarified by the deep level transient spectroscopy measurement. The prime species of defects are found to be AsGa and MnI etc.