intrinsic parameter fluctuations Latest Research Papers

Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.50.04dc11 ◽

2011 ◽

Vol 50 (4) ◽

pp. 04DC11 ◽

Cited By ~ 1

Author(s):

Yunxiang Yang ◽

Gang Du ◽

Ruqi Han ◽

Xiaoyan Liu

Keyword(s):

Metal Oxide ◽

Simulation Study ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations

Download Full-text

Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors

Japanese Journal of Applied Physics ◽

10.7567/jjap.50.04dc11 ◽

2011 ◽

Vol 50 (4S) ◽

pp. 04DC11

Author(s):

Yunxiang Yang ◽

Gang Du ◽

Ruqi Han ◽

Xiaoyan Liu

Keyword(s):

Metal Oxide ◽

Simulation Study ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations

Download Full-text

Benchmarking statistical compact modeling strategies for capturing device intrinsic parameter fluctuations in BSIM4 and PSP

IEEE Design & Test of Computers ◽

10.1109/mdt.2010.2 ◽

2011 ◽

Author(s):

Binjie Cheng ◽

Daryoosh Dideban ◽

Negin Moezi ◽

Campbell Millar ◽

Gareth Roy ◽

...

Keyword(s):

Compact Modeling ◽

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations

Download Full-text

Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit

10th IEEE International Conference on Nanotechnology ◽

10.1109/nano.2010.5697825 ◽

2010 ◽

Cited By ~ 1

Author(s):

Chun-Yen Yiu ◽

Yiming Li ◽

Ming-Hung Han ◽

Kuo-Fu Lee ◽

Thet-Thet Khaing ◽

...

Keyword(s):

Current Mirror ◽

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations

Download Full-text

Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm multi-gate MOSFET

2010 Silicon Nanoelectronics Workshop ◽

10.1109/snw.2010.5562570 ◽

2010 ◽

Cited By ~ 1

Author(s):

Hui-Wen Cheng ◽

Chun-Yen Yiu ◽

Thet-Thet Khaing ◽

Yiming Li

Keyword(s):

Aspect Ratio ◽

Current Mirror ◽

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations

Download Full-text

Statistical variability in FinFET devices with intrinsic parameter fluctuations

Microelectronics Reliability ◽

10.1016/j.microrel.2010.01.041 ◽

2010 ◽

Vol 50 (5) ◽

pp. 635-638 ◽

Cited By ~ 8

Author(s):

Chih-Hong Hwang ◽

Yiming Li ◽

Ming-Hung Han

Keyword(s):

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations ◽

Statistical Variability

Download Full-text

The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit

Microelectronics Reliability ◽

10.1016/j.microrel.2010.01.048 ◽

2010 ◽

Vol 50 (5) ◽

pp. 657-661 ◽

Cited By ~ 9

Author(s):

Ming-Hung Han ◽

Yiming Li ◽

Chih-Hong Hwang

Keyword(s):

High Frequency ◽

Frequency Characteristics ◽

Intrinsic Parameter ◽

The Impact ◽

Intrinsic Parameter Fluctuations ◽

Nano Mosfet

Download Full-text

Capturing intrinsic parameter fluctuations using the PSP compact model

2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) ◽

10.1109/date.2010.5457123 ◽

2010 ◽

Cited By ~ 1

Author(s):

B Cheng ◽

D Dideban ◽

N Moezi ◽

C Millar ◽

G Roy ◽

...

Keyword(s):

Compact Model ◽

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations

Download Full-text

Simulation of characteristic variation in 16 nm gate FinFET devices due to intrinsic parameter fluctuations

Nanotechnology ◽

10.1088/0957-4484/21/9/095203 ◽

2010 ◽

Vol 21 (9) ◽

pp. 095203 ◽

Cited By ~ 18

Author(s):

Yiming Li ◽

Chih-Hong Hwang ◽

Ming-Hung Han

Keyword(s):

Intrinsic Parameter ◽

Characteristic Variation ◽

Intrinsic Parameter Fluctuations

Download Full-text

Impact of intrinsic parameter fluctuations on the performance of In0.75Ga0.25As implant free MOSFETs

Semiconductor Science and Technology ◽

10.1088/0268-1242/24/5/055011 ◽

2009 ◽

Vol 24 (5) ◽

pp. 055011 ◽

Cited By ~ 2

Author(s):

N Seoane ◽

A Garcia-Loureiro ◽

M Aldegunde ◽

K Kalna ◽

A Asenov

Keyword(s):

Intrinsic Parameter ◽

Intrinsic Parameter Fluctuations

Download Full-text

intrinsic parameter fluctuations
Recently Published Documents

TOTAL DOCUMENTS

H-INDEX

Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors

Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors

Benchmarking statistical compact modeling strategies for capturing device intrinsic parameter fluctuations in BSIM4 and PSP

Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit

Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm multi-gate MOSFET

Statistical variability in FinFET devices with intrinsic parameter fluctuations

The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit

Capturing intrinsic parameter fluctuations using the PSP compact model

Simulation of characteristic variation in 16 nm gate FinFET devices due to intrinsic parameter fluctuations

Impact of intrinsic parameter fluctuations on the performance of In0.75Ga0.25As implant free MOSFETs

Export Citation Format

intrinsic parameter fluctuationsRecently Published Documents

TOTAL DOCUMENTS

H-INDEX

Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors

Simulation Study of Intrinsic Parameter Fluctuations in Variable-Body-Factor Silicon-on-Thin-Box Metal Oxide Semiconductor Field Effect Transistors

Benchmarking statistical compact modeling strategies for capturing device intrinsic parameter fluctuations in BSIM4 and PSP

Effect of intrinsic-parameter fluctuations on 16-nm-gate CMOS and current mirror circuit

Intrinsic parameter fluctuations on current mirror circuit with different aspect ratio of 16-nm multi-gate MOSFET

Statistical variability in FinFET devices with intrinsic parameter fluctuations

The impact of high-frequency characteristics induced by intrinsic parameter fluctuations in nano-MOSFET device and circuit

Capturing intrinsic parameter fluctuations using the PSP compact model

Simulation of characteristic variation in 16 nm gate FinFET devices due to intrinsic parameter fluctuations

Impact of intrinsic parameter fluctuations on the performance of In0.75Ga0.25As implant free MOSFETs

intrinsic parameter fluctuations
Recently Published Documents