crystallographic property
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scholarly journals Mechanical, Electrical, and Crystallographic Property Dynamics of Bent and Strained Ge/Si Core–Shell Nanowires As Revealed by in situ Transmission Electron Microscopy

Nano Letters ◽  
2018 ◽  
Vol 18 (11) ◽  
pp. 7238-7246 ◽  
Author(s):  
Chao Zhang ◽  
Dmitry G. Kvashnin ◽  
Laure Bourgeois ◽  
Joseph F. S. Fernando ◽  
Konstantin Firestein ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Core Shell ◽  
Transmission Electron ◽  
Crystallographic Property ◽  
Shell Nanowires

Structural Properties of Ag-Based Chalcopyrite Compound Thin Films for Solar Cells

2005 ◽  
Vol 865 ◽  
Author(s):  
Hiroki Ishizaki ◽  
Keiichiro Yamada ◽  
Ryouta Arai ◽  
Yasuyuki Kuromiya ◽  
Yukari Masatsugu ◽  
...  
Keyword(s):  
Thin Films ◽  
Rietveld Analysis ◽  
Atomic Ratio ◽  
Band Gap Energy ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Glass Substrates ◽  
Crystallographic Property ◽  
Chalcopyrite Compound

AbstractAgGa5Se8 and Ag(In1-xGax)Se2 thin films with different Ag/Ga atomic ratios have been deposited on the corning 1737 glass substrates by molecular beam epitaxy (MBE) system. This crystallographic property of AgGa5Se8 thin films has been investigated by x-ray diffraction and rietveld analysis. These films had the tetragonal structure with the space group of P-42m, regardless of Ag/Ga atomic ratio. The lattice parameters and the optical band gap energy decreased with an increase in the Ag/Ga atomic ratio. Thus, the structural and optical properties of these AgGa5Se8 thin films were controlled by the Ag/Ga atomic ratio.

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