dielectric loss function
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2005 ◽  
pp. 193-198
Author(s):  
A. P. Vieira ◽  
M. López de Haro ◽  
J. Tagüeña-Martínez ◽  
L. L. Gonçalves

1994 ◽  
Vol 22 (1-12) ◽  
pp. 124-128 ◽  
Author(s):  
F. Yubero ◽  
J. M. Sanz ◽  
J. F. Trigo ◽  
E. Elizalde ◽  
S. Tougaard

1993 ◽  
Vol 20 (8) ◽  
pp. 719-726 ◽  
Author(s):  
F. Yubero ◽  
S. Tougaard ◽  
E. Elizalde ◽  
J. M. Sanz

1993 ◽  
Vol 46 (5) ◽  
pp. 635 ◽  
Author(s):  
TW Josefsson ◽  
AE Smith

The influence of microscopic or local fields on the full frequency- and wavevector-dependent dielectric loss function of Si has been calculated, based on accurate empirical pseudopotential calculations of the electronic structure. It is shown that local-field effects, dramatically significant at optical (q ~ 0) wavevectors, diminish with increasing magnitude of q to negligible proportions as q approaches the Brillouin zone boundary. In addition it is shown that the calculated volume-plasmon dispersion relation is improved in comparison with experimental results by the inclusion of local-field effects.


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