TReMo+: Modeling Ternary and Binary ReRAM-Based Memories With Flexible Write-Verification Mechanisms

Non-volatile memory (NVM) technologies offer a number of advantages over conventional memory technologies such as SRAM and DRAM. These include a smaller area requirement, a lower energy requirement for reading and partly for writing, too, and, of course, the non-volatility and especially the qualitative advantage of multi-bit capability. It is expected that memristors based on resistive random access memories (ReRAMs), phase-change memories, or spin-transfer torque random access memories will replace conventional memory technologies in certain areas or complement them in hybrid solutions. To support the design of systems that use NVMs, there is still research to be done on the modeling side of NVMs. In this paper, we focus on multi-bit ternary memories in particular. Ternary NVMs allow the implementation of extremely memory-efficient ternary weights in neural networks, which have sufficiently high accuracy in interference, or they are part of carry-free fast ternary adders. Furthermore, we lay a focus on the technology side of memristive ReRAMs. In this paper, a novel memory model in the circuit level is presented to support the design of systems that profit from ternary data representations. This model considers two read methods of ternary ReRAMs, namely, serial read and parallel read. They are extensively studied and compared in this work, as well as the write-verification method that is often used in NVMs to reduce the device stress and to increase the endurance. In addition, a comprehensive tool for the ternary model was developed, which is capable of performing energy, performance, and area estimation for a given setup. In this work, three case studies were conducted, namely, area cost per trit, excessive parameter selection for the write-verification method, and the assessment of pulse width variation and their energy latency trade-off for the write-verification method in ReRAM.

Comprehensive understanding of the structure-stacking property correlation to achieve high-performance ternary data-storage devices

Two small-molecule isomers with consistent functional units exhibit total different molecular stacking modes, rendering the memory behaviours from traditional binary memory to typical ternary memory.

Isomerization change and charge trap double mechanisms induced ternary data storage performance

An azo-based small molecule (NACB) is designed with well-definite film crystallinity, and exhibits three different current states under a continuous electric field, which is owing to the cooperated isomerization change and charge trap mechanisms.

Error-Vulnerable Pattern-Aware Binary-to-Ternary Data Mapping for Improving Storage Density of 3LC Phase Change Memory

Multi-level cell (MLC) phase-change memory (PCM) is an attractive solution for next-generation memory that is composed of resistance-based nonvolatile devices. MLC PCM is superior to dynamic random-access memory (DRAM) with regard to scalability and leakage power. Therefore, various studies have focused on the feasibility of MLC PCM-based main memory. The key challenges in replacing DRAM with MLC PCM are low reliability, limited lifetime, and long write latency, which are predominantly affected by the most error-vulnerable data pattern. Based on the physical characteristics of the PCM, where the reliability depends on the data pattern, a tri-level-cell (3LC) PCM has significantly higher performance and lifetime than a four-level-cell (4LC) PCM. However, a storage density is limited by binary-to-ternary data mapping. This paper introduces error-vulnerable pattern-aware binary-to-ternary data mapping utilizing 3LC PCM without an error-correction code (ECC) to enhance the storage density. To mitigate the storage density loss caused by the 3LC PCM, a two-way encoding is applied. The performance degradation is minimized through parallel encoding. The experimental results demonstrate that the proposed method improves the storage density by 17.9%. Additionally, the lifetime and performance are enhanced by 36.1% and 38.8%, respectively, compared with those of a 4LC PCM with an ECC.

Rewritable ternary data storage devices based on polymethacrylate containing pendent azobenzene–naphthalene with the combined effects of conformation change and charge traps

We formed an ITO/polymer/Al device showing different memory characteristics with various alkyl lengths in the side-chains of the polymers.