Prevalence urinary tract infections in newborns of Baghdad hospital

In the neonatal period, urinary tract infection sepsis and urinary system It is an important clinical problem because it can be associated with congenital anomalies. The aim was determine the prevalence of UTI and the causative agent in neonates with their antibiotics sensitivity patterns. This study was planned as cross-sectional study. urinary tract at a 4-year time interval in a primary neonatal unit. It was performed on newborns who were hospitalized with the diagnosis of infection. patient data It was obtained retrospectively from patient files. Prior hospitalization, urinary catheterization, premature birth and urinary Newborns with multipathogen growth in their culture were not included in the study. for study Consent was obtained from the local ethics committee. Urinary tract infection, urine sample taken by bladder catheterization 10000-50000 CFU/ml colony count or pyuria in the presence of pyuria in the culture Colony count of ≥50000 CFU/ml in the absence of microorganism was defined as growth. Gender of the patients, weeks of gestation, mode of delivery, birth weight, urinary tract postnatal days of diagnosis of infection. The difference and relationships between the obtained data were statistically evaluated. In the present study, 186 urine specimens from neonates with UTI, 110(59.13%) were positive for bacterial culture. In addition 100 specimens from healthy neonates (control) included in the present study, only 8 (8%) were positive for bacterial culture The study showed that, E. coli were the most isolated bacteria According to the distribution of the isolated bacteria among the study groups, K. pneumoniae is the second, S. aureus and P. mirabilis the least isolated bacteria from neonates, The study showed that majority of neonates with UTI were females (65.45%) and 34.55% were males, The study demonstrated that, most cases suffered from dysuria due to UTI and 27.27% suffered from fever, The research indicated that, S. aureus showed high rate of sensitivity to ciprofloxacin and oxacillin (88.23%) and resistant to ampicillin and lincomycin. S. saprophyticus showed were sensitive to cephalothin, ciprofloxacin, oxacillin and lincomycin and complete resistant to ampicillin, erythromycin and amikacin. Streptococcus faecalis showed 100% sensitivity to oxacillin while it was resistant to ciprofloxacin, ampicillin, erythromycin and amikacin. E. coli isoaltes were 53 sensitive to to ceftazidim and resistant to oxacillin and lincomycin . K. pneumoniae were sensitive to amoxiclave and resistant to ampicillin, tetracycline, erythromycin, oxacillin and lincomycin. Proteus mirabilis was sensitive to cefotaxim and it was resistant to erythromycin, ampicillin, oxacillin and lincomycin. Proteus vulgaris showed high sensitivity rate to nirtrofurontoin, cefotaxim (92.85%) and low rate of sensitivity to erythromycin (Figure 4.8). Pseudomonas aeroginosae showed high sensitivity rate to cefotaxim (86.66% ) and low rate of sensitivity (20%) to ampicillin.

Pengaruh Medan Listrik Terhadap Komponen Elektronik

This research reviewed the effect of induction voltage resulting of the electromagnetic induction from the thunderbolt attack to the electronic equipment especially if the induction effect to the component has a high sensitivity rate that was IC CMOS component. In this study the experiments done in the laboratory of High Voltage Technique where the impulse voltage as a simulation to the thunderbolt external voltage surge for the Electronic circuit. Experiment I the distance component of the test article to the test point was 5 cm with the impulse voltage of 99.3 kV, induction voltage 158.41 V, Experiment II with the distance of 7.5 cm, the impulse voltage 88.3 kV so the induction voltage 105.62 V IC, in the experiment III the distance of the test article was 10 cm from the test point. The impulse voltage 88.3 kV and the induction voltage was 79.2 V, In the experiment IV the component distance was 15 cm. the impulse voltage 88.3 kV and the induction voltage as big as 52.74 V.From each experiment IC make damage, where distance component from each experiment settled more distant so component no make damage. From the measurement and calculation yields then the induction voltage resulted will damage the IC component conformed to the yield presented by Hasse in the table 2.1 where the component CMOS 70-100V. Where the study results proved that the electromagnetic induction from indirect thunderbolt attach can result an interference and damage to the electronic component tested, as the distance between the component and the ball gap to the impulse tension was very influential in determining of damaged mechanism of IC in self.