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2020 ◽  
Vol 68 ◽  
pp. 4568-4582
Author(s):  
Adeem Aslam ◽  
Zubair Khalid
Keyword(s):  

2018 ◽  
Vol 106 ◽  
pp. 61-67 ◽  
Author(s):  
Daniel Sierra-Sosa ◽  
Myrian Tebaldi ◽  
Eduardo Grumel ◽  
Hector Rabal ◽  
Adel Elmaghraby

IEEE Access ◽  
2017 ◽  
Vol 5 ◽  
pp. 19961-19970
Author(s):  
Elisabeth Leiss-Holzinger ◽  
Karoline Felbermayer ◽  
Dzenan Ismic ◽  
Christian Rankl ◽  
Johannes Hillmann ◽  
...  

2013 ◽  
Vol 585 ◽  
pp. 26-33 ◽  
Author(s):  
Hyung Rae Kim ◽  
Ralph R.B. von Frese

2010 ◽  
Vol 449 ◽  
pp. 87-95 ◽  
Author(s):  
Pedro A. Tamayo Meza ◽  
Pablo S. Schabes-Retchkiman ◽  
Alejandra Lazo Noguez ◽  
Viacheslav A. Yermishkin

In this paper is presented a study of the analysis of the stress state of micro specimens exposed to a load inside the column of a High Voltage Electron Microscope (HVTEM), in particular for a Mo single crystal. The experimental tangential stresses distribution images were obtained and compared with theoretical calculations using Naiber approach, obtaining an excellent match.


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