Predicting the values of average stresses during the ice–water phase transition in mesoporous silicon-based structures in the temperature range 233...273 K

Theoretical model has been developed for predicting the average stress values during melting of water frozen in silicon-based mesoporous structures in the temperature range 233...273 K, caused by the difference in the thermal expansion coeffi cients of the heterogeneity elements in the materials studied. Numerical calculations were carried out using and dependences of the average stress tensor components on the volumetric water content in the mesoporous silicon matrix were investigated.