microwave imaging reflectometry
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2020 ◽  
Vol 15 (0) ◽  
pp. 2402060-2402060
Author(s):  
Yoshio NAGAYAMA ◽  
Akira EJIRI ◽  
Yuichi TAKASE ◽  
Naoto TSUJII ◽  
Hideya NAKANISHI ◽  
...  

2020 ◽  
Vol 15 (03) ◽  
pp. C03036-C03036
Author(s):  
W. Liao ◽  
F.X. Gao ◽  
C.M. Qu ◽  
X.H. Xu ◽  
L.F. Zhang ◽  
...  

2016 ◽  
Author(s):  
Benjamin Tobias ◽  
Gustav Kramer ◽  
Ernest J. Valeo ◽  
Chris M. Muscatello ◽  
Xiaoxin Ren ◽  
...  

2016 ◽  
Vol 18 (4) ◽  
pp. 449-452 ◽  
Author(s):  
Yilun Zhu ◽  
Zhenling Zhao ◽  
Li Tong ◽  
Dongxu Chen ◽  
Jinlin Xie ◽  
...  

2016 ◽  
Vol 11 (0) ◽  
pp. 2402111-2402111 ◽  
Author(s):  
Yoshio NAGAYAMA ◽  
Soichiro YAMAGUCHI ◽  
Zongbing SHI ◽  
Hayato TSUCHIYA ◽  
Shigehiro HASHIMOTO ◽  
...  

2015 ◽  
Vol 10 (10) ◽  
pp. P10036-P10036 ◽  
Author(s):  
X. Ren ◽  
M. Chen ◽  
X. Chen ◽  
C.W. Domier ◽  
N.M. Ferraro ◽  
...  

2014 ◽  
Vol 85 (11) ◽  
pp. 11D863 ◽  
Author(s):  
X. Ren ◽  
C. W. Domier ◽  
G. Kramer ◽  
N. C. Luhmann ◽  
C. M. Muscatello ◽  
...  

2014 ◽  
Vol 85 (11) ◽  
pp. 11D816 ◽  
Author(s):  
Shi Zhongbing ◽  
Jiang Min ◽  
Che Yonglong ◽  
Wang Bin ◽  
Yin Yong ◽  
...  

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