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WAVE OPTICAL TREATMENT OF SURFACE STEP CONTRAST IN LOW-ENERGY ELECTRON MICROSCOPY

2009 ◽  
Vol 16 (06) ◽  
pp. 855-867 ◽  
Author(s):  
S. M. KENNEDY ◽  
N. E. SCHOFIELD ◽  
D. M. PAGANIN ◽  
D. E. JESSON
Keyword(s):  
Electron Microscopy ◽  
Transfer Function ◽  
Imaging System ◽  
Two Dimensions ◽  
Low Energy ◽  
Energy Electron ◽  
Surface Step ◽  
Optical Treatment ◽  
Low Energy Electron ◽  
Step Contrast

A wave optical treatment of surface step contrast in a low-energy electron microscopy (LEEM) is presented. The aberrations of an idealised LEEM imaging system are directly incorporated into a transfer function (TF) and image simulations of surface steps are evaluated in one and two dimensions. Under the special circumstances of a weak phase object, the simplified form of the contrast transfer function (CTF) is used to discuss LEEM image contrast and optimum defocus conditions.

Step contrast reversal in LEEM during Pb deposition on W(110)

2009 ◽  
Vol 21 (31) ◽  
pp. 314024 ◽  
Author(s):  
T Yasue ◽  
R Amakawa ◽  
H Shimizu ◽  
A Nakaguchi ◽  
T Koshikawa ◽  
...  
Keyword(s):  
Step Contrast

Step contrast in low energy electron microscopy

1998 ◽  
Vol 74 (4) ◽  
pp. 237-246 ◽  
Author(s):  
W.F. Chung ◽  
M.S. Altman
Keyword(s):  
Electron Microscopy ◽  
Low Energy ◽  
Energy Electron ◽  
Low Energy Electron ◽  
Step Contrast

Atomic step contrast from forbidden reflections

1985 ◽  
Vol 16 (1) ◽  
pp. 41-46 ◽  
Author(s):  
C.J. Rossouw ◽  
S.E. Donnelly ◽  
D.F. Lynch
Keyword(s):  
Atomic Step ◽  
Step Contrast

Step contrast on ultrathin Au films investigated by TEM

1985 ◽  
Vol 17 (1) ◽  
pp. 73-79 ◽  
Author(s):  
M. Klaua ◽  
H. Bethge
Keyword(s):  
Step Contrast
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