ASSESSMENT OF ELECTRICALLY ACTIVE DEFECT PARAMETERS IN POLYARYLENPHTHALIDES

Trapping state parameters in thin films of polyarylenephthalide polymers with different chemical structures were studied using the thermally stimulated current (TSC) method. As the objects of our research we used polyarylenephthalide polymers - polydiphenylphthalide (PDP) [1] and phthalide-based statistical co-polyarylene ether ketones (co-PAEK) [2]. It was revealed in the paper that the energy of trapping state activation essentially depends on the concentration of phhalide-containing fragments.

A Highly Active Defect Engineering Cl-doped Carbon Catalyst for N2 Reduction Reaction

The eNRR is a promisingly environment-friendly strategy to obtain ammonia under ambient conditions. For metal-based catalysts, the competitive adsorption of H+ over N2 remains the primary hurdle for high ammonia...