atomic force microscopy method
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2019 ◽  
Vol 54 (17) ◽  
pp. 11448-11461 ◽  
Author(s):  
Caterina Czibula ◽  
Christian Ganser ◽  
Tristan Seidlhofer ◽  
Christian Teichert ◽  
Ulrich Hirn

2016 ◽  
Vol 17 (1) ◽  
pp. 65-69
Author(s):  
Ya.P. Saliy ◽  
V.I. Makovyshyn ◽  
I.S. Bylina ◽  
N.I. Bushkov

The analysis was obtained by atomic force microscopy method of topograms nanostructures on the surface of vapor-phase condensation  of  SnTe: Bi, thet were opened deposited by evaporation in a vacuum on substrates of ceramics. With the distribution of polar and azimuthal angles of the normal  vector to the surface elements of condensate was found objects with flat faces with by dominant orientation in space and by symmetry.


2014 ◽  
Vol 50 (15) ◽  
pp. 1487-1494 ◽  
Author(s):  
A. M. Dobrotvorskii ◽  
E. I. Maslikova ◽  
E. P. Shevyakova ◽  
P. G. Ul’yanov ◽  
D. Yu. Usachev ◽  
...  

2010 ◽  
Vol 58 (6) ◽  
pp. 813-820 ◽  
Author(s):  
Laura M. Kosoglu ◽  
Barry R. Bickmore ◽  
George M. Filz ◽  
Andrew S. Madden

2006 ◽  
Vol 1 (1) ◽  
pp. 63-73 ◽  
Author(s):  
A. Amy Yu ◽  
Peter R. Stone ◽  
Julie E. Norville ◽  
Michael Vaughn ◽  
Eden J. Pacsial ◽  
...  

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