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Author(s):  
Konstantin Petrosyants

RAD-THERM-AGING versions of TCAD and SPICE models have been developed for BiCMOS VLSI components with submicron and nanometer sizes, taking into account for various types of radiation effects, temperatures in the wide range of -260°C…+300°C and aging during long-term operation.


2011 ◽  
Vol 49 (10) ◽  
pp. 182-189 ◽  
Author(s):  
John Long ◽  
Wei Chan ◽  
Yi Zhao ◽  
Marco Spirito
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