Leakage Power Reduction for Deeply-Scaled FinFET Circuits Operating in Multiple Voltage Regimes Using Fine-Grained Gate-Length Biasing Technique

Author(s):  
Ji Li ◽  
Qing Xie ◽  
Yanzhi Wang ◽  
Shahin Nazarian ◽  
Massoud Pedram
2018 ◽  
Vol 6 (2) ◽  
pp. 1
Author(s):  
SEKHAR REDDY M. CHANDRA ◽  
REDDY P. RAMANA ◽  
◽  

2005 ◽  
Vol 2 (3) ◽  
pp. 221-246 ◽  
Author(s):  
Yan Meng ◽  
Timothy Sherwood ◽  
Ryan Kastner

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