scholarly journals Multielement analysis of plant extracts with potential use in the treatment of peptic ulcers by synchrotron radiation total reflection X-ray fluorescence

PeerJ ◽  
2018 ◽  
Vol 6 ◽  
pp. e5375
Author(s):  
Leticia Diniz Vieira ◽  
Káthia Takeda da Silva ◽  
Rodrigo Sanchez Giarola ◽  
Guilherme Franco Inocente ◽  
Hélio Kushima ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Intermediate Stage ◽  
Total Reflection ◽  
New Drugs ◽  
Peptic Ulcers ◽  
X Ray ◽  
Analytical Technique ◽  
Methanolic Extracts ◽  
Synchrotron Light ◽  
Almost All

Some plants popularly employed for the treatment of peptic ulcers have proved to be attractive sources of new drugs. Despite extensive research, the pharmacological and toxicological potentials of these plants are not fully understood. In this context, the aim of this work was to analyze the multielemental composition of the methanolic extracts of three of those plants, Alchornea glandulosa (AG), Davilla elliptica (DE) and Davilla nitida (DN), with the intention of contributing to the understanding of the mechanisms of action of these extracts. For this purpose, we used the analytical technique of total reflection X-ray fluorescence (TXRF) by synchrotron radiation at the Brazilian Synchrotron Light Source (LNLS/CNPEM). It was possible to determine the concentrations of the elements: P, S, Cl, K, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Rb and Br in all of the samples. Selenium (Se) was detected only in the DN extract. An inverse relationship between the concentrations of elements with proven effectiveness and the gastroprotective activity of extracts considering induction protocols with ethanol and non-steroidal anti-inflammatory drugs (NSAIDs) was obtained. This data suggests that the function of the extract is not only associated with providing the elements for restoring the gastric mucosa but that it also promotes the displacement of these elements from other parts of the mucosa to the damaged area. Correlations between the concentrations of the elements were also obtained. In the DE extract, which is the most effective extract for both induction protocols, the obtained correlations were above 70% among almost all of the elements, and no anticorrelations were found. For the other two extracts, in the less effective extract (AG) anticorrelations above 70% were predominantly found. Meanwhile, in the DN extract, a few high anticorrelations were found, which may explain its intermediate stage of effectiveness.

Total Reflection X-Ray Fluorescence (TXRF)

1994 ◽  
Vol 354 ◽  
Author(s):  
R. S. Hockett
Keyword(s):  
Synchrotron Radiation ◽  
Metal Contamination ◽  
Total Reflection ◽  
Semiconductor Processing ◽  
X Ray ◽  
Analytical Technique ◽  
Semiconductor Substrates ◽  
The Future ◽  
Surface Metal

AbstractTotal reflection X-Ray Fluorescence (TXRF) is a glancing x-ray analytical technique which is used primarily to measure surface metal contamination on semiconductor substrates. This is a review of Total reflection X-Ray Fluorescence (TXRF) applications for silicon semiconductor processing. In addition, some comments are made about the future of TXRF, and in particular, synchrotron radiation TXRF (SR-TXRF)

Update On Synchrotron Radiation TXRF: New Results

1998 ◽  
Vol 524 ◽  
Author(s):  
S. Brennan ◽  
P. Pianetta ◽  
S. Ghosh ◽  
N. Takaura ◽  
C. Wiemer ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Total Reflection ◽  
Synchrotron Source ◽  
X Ray ◽  
Non Destructive

ABSTRACTSynchrotron-based total-reflection x-ray fluorescence(SR-TXRF) has been developed as a leading technique for measuring wafer cleanliness. It holds advantages over other techniques in that it is non-destructive and allows mapping of the surface. The highest sensitivity observed thus far is 3x108 atoms/cm 2 (- 3fg) for 1000 second count time. Several applications of SR-TXRF are presented which take advantage of the energy tunability of the synchrotron source or the mapping capability.

Multi-elemental analysis of produced water by synchrotron radiation total reflection X-ray fluorescence

Talanta ◽  
2008 ◽  
Vol 74 (5) ◽  
pp. 1231-1235 ◽  
Author(s):  
P.M. Pimentel ◽  
M.J. Anjos ◽  
D.M.A. Melo ◽  
M.A.F. Melo ◽  
L.M. Gonçalves Jr. ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Elemental Analysis ◽  
Produced Water ◽  
Total Reflection ◽  
X Ray

X-Ray Absorption Spectroscopy Applied to Metal Accumulation

2009 ◽  
Vol 71-73 ◽  
pp. 613-616
Author(s):  
Regina Pinto de Carvalho ◽  
G.C. Silva ◽  
M. Sylvia S. Dantas ◽  
I.F. Vasconcelos ◽  
Virgínia S.T. Ciminelli
Keyword(s):  
Physical State ◽  
Unique Feature ◽  
Metal Accumulation ◽  
X Rays ◽  
Absorption Probability ◽  
X Ray ◽  
Analytical Technique ◽  
Absorption Phenomenon ◽  
Almost All ◽  
X Ray Absorption

X-Rays Absorption Fine Structure Spectroscopy (XAFS) is an analytical technique that can be used as a probe to characterize almost all elements, even if they appear in diluted or non-crystalline systems. This is due to the fact that the absorption probability of X-rays has a unique feature for each element, and is modulated by the chemical and physical state of that element, as well as by its neighborhood. This paper presents a brief description of the X-rays absorption phenomenon and the analytical technique involving this phenomenon, as well as the application of XAFS in biosorption studies. For more details on XAFS theory, refer to [1].

Synchrotron radiation total reflection X-ray fluorescence (SR-TXRF) for evaluation of food contamination

2006 ◽  
Vol 270 (1) ◽  
pp. 147-153 ◽  
Author(s):  
A. E. S. Vives ◽  
S. Moreira ◽  
S. M. B. Brienza ◽  
O. L. A. Zucchi ◽  
V. F. Nascimento Filho
Keyword(s):  
Synchrotron Radiation ◽  
Food Contamination ◽  
Total Reflection ◽  
X Ray
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